Ayers, R.
(2015),
Mobile Device Tool Testing, Mobile Device Tool Testing, Washington, DC
(Accessed April 11, 2025)
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Mobile Device Tool Testing
Published
Author(s)
Abstract
The Computer Forensic Tool Testing program at NIST has spent several years researching and testing forensic tools capable of acquiring data from the internal memory of mobile devices and Subscriber Identity Modules (SIMs). Test reports provide a foundation for toolmakers to improve tools, users to make informed choices, and provide interested parties with an overview of any anomalies found. The presentation will provide an overview of the motivation behind testing mobile device forensic tools and the challenges faced by toolmakers and forensic examiners.Proceedings Title
Mobile Device Tool Testing
Conference Dates
February 18-June 23, 2013
Conference Location
Washington, DC
Pub Type
Conferences
Keywords
Mobile Device Forensics, Digital, Testing
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 18, 2015, Updated June 24, 2021