Multispectral Probes for Materials and Chemical Analysis

Published

October 1, 2001

Author(s)

Steven A. Buntin

Abstract

High throughput experimentation is currently restricted by its limited ability to evaluate more than one parameter of a library at a time (e.g., chemical composition, dielectric constant, refractive index, surface roughness, phase , luminescence). When compared to the highly parallel synthetic strategies used to generate combinatorial libraries, the serial screening processes may ultimately limit the obtainable throughput of a combinatorial method. With the ability to rapidly prepare complex libraries to support a broad range of performance attributes, it will become increasingly valuable to be able to collect performance and compositional information simultaneously thereby gaining a multiplex/multichannel advantage. To this end, NIST is developing measurement platforms that exploit non-contact, multi-tasked microscopies and spectroscopies. Our work focuses on the development of ultra-broadband scanning evanscent probe microscopy and spectroscopy; this instrumentation will target the ability to simultaneously measure a set of compositional and performance properties of chemically testured samples. Results for variable-composition oxide and polymeric samples will be highlighted.

Proceedings Title

MULTISPECTRAL PROBES FOR MATERIALS AND CHEMICAL ANALYSIS

Conference Dates

November 16, 2001

Conference Location

Philadelphia, PA

Conference Title

CombiCat 2001 Conference

Pub Type

Conferences

Keywords

combinatorial chemistry/catalyst, high throughput experimentation, hyperspectral imaging, infrared, NSOM, Raman, scanned probe

Citation

Buntin, S. (2001), Multispectral Probes for Materials and Chemical Analysis, MULTISPECTRAL PROBES FOR MATERIALS AND CHEMICAL ANALYSIS, Philadelphia, PA (Accessed November 21, 2024)