Kos, A.
and Hurley, D.
(2007),
Nanomechanical Mapping with Resonance Tracking Scanned Probe Microscope, Review of Scientific Instruments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32350
(Accessed November 20, 2024)
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Nanomechanical Mapping with Resonance Tracking Scanned Probe Microscope
Published
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Abstract
We present a new digital-signal-processor-based resonance tracking system for scanned probe microscopy (SPM) imaging. The system was developed to enable quantitative imaging of mechanical properties with nanoscale spatial resolution at practical data acquisition rates. It consists of a 32-bit floating-point digital signal processor connected to a high-resolution audio coder/decoder subsystem, an rms-to-dc converter, and a voltage-controlled oscillator. These components are used in conjunction with a commercial atomic force microscope to create a versatile platform for SPM mechanical mapping. Images of a glass-fiber/polymer matrix composite sample are presented to demonstrate system performance.Citation
Review of Scientific Instruments
Volume
19
Pub Type
Journals
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Keywords
atomic force acoustic microscopy, atomic force microscope, contact-resonance spectroscopy, digital signal processor, elastic modulus, rms-to-dc converter, scanned probe microscopy
Citation
Issues
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Created November 22, 2007, Updated October 12, 2021