Imtiaz, A.
, Wallis, T.
and Kabos, P.
(2012),
Near-Field Scaning Microwave Microscope (NSMM), McGraw Hill Encyclopedia for Science and Technology (2013), [online], https://doi.org/10.1036/1097-8542.YB130175
(Accessed November 28, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Near-Field Scaning Microwave Microscope (NSMM)
Published
Author(s)
, ,
Abstract
Electromagnetic waves in the microwave frequency range are an essential tool for the investigation of material and device properties across a broad range of applications. Examples of materials of interest include: ferroelectric materials, ferromagnetic materials, superconductors, semiconductors, graphene, carbon nanotubes, fullerenes, and life science materials, among others. These materials are studied in multiple scales, including bulk, thin film and ideally down to the scale of individual molecules. Examples of devices of interest include: electron charge- and spin-based nanoelectronics, bio-inspired devices, superconducting devices, and magneto-resistive devices, among many others.Citation
McGraw Hill Encyclopedia for Science and Technology (2013)
Pub Type
Encyclopedias
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 2012, Updated November 10, 2018