NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

Published

March 1, 2001

Author(s)

Cedric J. Powell, Aleksander Jablonski, A Naumkin, A Kraut-Vass, Joseph M. Conny, J R. Rumble

Abstract

A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an XPS Database, an Electron Elastic-Scattering Cross-Section Database, and an Electron Inelastic-Mean-Free-Path Database. NIST also offers Standard Test Data (STD) for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet. The XPS database and the XPS-STD are available over the internet.

Proceedings Title

ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure
Journal of Electron Spectroscopy and Related Phenomena

Volume

114-116

Conference Dates

August 8-12, 2000

Conference Location

Berkeley, CA

Pub Type

Conferences

Keywords

Auger-electron spectroscopy, databases, electron elastic-scattering cross sectio, electron inelastic mean free paths, standard test data, surface analysis, x-ray photoelectron spectroscopy

Citation

Powell, C. , Jablonski, A. , Naumkin, A. , Kraut-Vass, A. , Conny, J. and Rumble, J. (2001), NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy, ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure Journal of Electron Spectroscopy and Related Phenomena, Berkeley, CA (Accessed July 17, 2024)