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Optimizing Instrument Operation and Data Processing for Single Particle Inductively Coupled Plasma Mass Spectrometry Measurement of Gold Nanoparticles

Published

Author(s)

Jingyu Liu, Karen E. Murphy, Robert I. MacCuspie, Michael R. Winchester

Abstract

Inductively coupled plasma mass spectrometry (ICP-MS) operated in single particle mode is an attractive analytical tool capable of both sizing and counting metal containing nanoparticles in aqueous suspensions. In this study, we have evaluated the performance of single particle-ICP-MS (spICP-MS) for gold nanoparticle (AuNPs) characterization. Instrument operating parameters, test solution concentration and data processing were optimized for accurate size and particle number concentration measurement. We demonstrate that short measurement dwell time induces severe particle splitting between adjacent dwells, and the optimal dwell time, limiting both splitting and coincident particle events, is 10 ms. A pre-established protocol for particle size calculation using the measured aerosol transport efficiency and soluble standard calibration was examined over a range of AuNPs diameters from 10 nm to 200 nm. Finally, size measurements were performed on heterogeneous Au solutions containing both soluble Au and AuNPs.
Proceedings Title
Nanotech Conference Technical Proceedings
Volume
1
Conference Dates
May 12-16, 2013
Conference Location
Washington, DC
Conference Title
Nanotech Conference 2013

Keywords

Single particle ICP-MS, nanomaterial characterization, gold nanoparticles

Citation

Liu, J. , Murphy, K. , MacCuspie, R. and Winchester, M. (2013), Optimizing Instrument Operation and Data Processing for Single Particle Inductively Coupled Plasma Mass Spectrometry Measurement of Gold Nanoparticles, Nanotech Conference Technical Proceedings, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=913478 (Accessed December 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 16, 2013, Updated February 19, 2017