Hubmayr, J.
, Beall, J.
, Becker, D.
, Cho, H.
, Hilton, G.
, Li, D.
, Pappas, D.
, Van, J.
, Devlin, M.
, Irwin, K.
, Groppi, C.
and Mauskopf, P.
(2015),
Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors, Applied Physics Letters, [online], https://doi.org/10.1063/1.4913418
(Accessed November 21, 2024)
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Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors
Published
Author(s)
, , , , , , , , Mark Devlin, Kent D. Irwin, Chris Groppi, Phillip Mauskopf
Abstract
We demonstrate photon-noise limited performance at sub-millimeter wavelengths in microwave kinetic inductance detectors (MKIDs) made of a new superconducting material, a TiN/Ti/TiN trilayer film. Optical coupling is achieved by use of feedhorns, a standard approach at sub-millimeter wavelengths that is an emerging MKID coupling scheme. The lumped-element detector design enables dual-polarization sensitivity. The devices are fabricated on a silicon-on-insulator (SOI) wafer. Micro-machining of the SOI wafer backside creates a quarter-wavelength backshort optimized for efficient coupling at 250 μm. When viewing a variable temperature thermal source, devices show noise consistent with that due to photon fluctuations at photon loads > 1 pW, suitable for broadband photometric applications.Citation
Applied Physics Letters
Volume
106
Issue
7
Pub Type
Journals
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Created February 20, 2015, Updated November 10, 2018