Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Precise evaluation of the 129 k? and 1 M? quantum Hall array devices for a quantum Wheatstone bridge

Published

Author(s)

Takehiko Oe, Alireza R. Panna, Randolph E. Elmquist, Dean G. Jarrett, Yasuhiro Fukuyama, Nobu-Hisa Kaneko

Abstract

We have fabricated 129 kΩ and 1 MΩ quantum Hall array devices using GaAs/AlGaAs heterostructures and their quantized Hall resistance plateaus were precisely evaluated with an accuracy of better than 5×10-8 based on NIST’s quantized Hall resistance standard via stable standard resistors. These higher quantized values have been attracting industrial interests for applications such as precise small electric power (small current) measurements, leakage current, and electrical insulation measurements. Given these quantum Hall array devices, an accuracy of better than 1×10-7 for 10 MΩ resistance standard measurements will be achieved, through a simple cryogenic quantum Wheatstone bridge technique. These devices could also be utilized for a quantum voltage divider.
Proceedings Title
2020 Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO
Conference Title
Conference on Precision Electromagnetic Measurements (CPEM)

Keywords

Quantum Hall effect, Resistance standard, Quantum Hall array resistance standards, GaAs/AlGaAs, High resistance measurement

Citation

Oe, T. , Panna, A. , Elmquist, R. , Jarrett, D. , Fukuyama, Y. and Kaneko, N. (2020), Precise evaluation of the 129 k? and 1 M? quantum Hall array devices for a quantum Wheatstone bridge, 2020 Conference on Precision Electromagnetic Measurements (CPEM), Denver, CO (Accessed November 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 23, 2020, Updated September 1, 2020