Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Probing Charge Transport in Molecular Electronic Junctions With Transition Voltage Spectroscopy

Published

Author(s)

J M. Beebe, BongSoo Kim, C D. Frisbie, James G. Kushmerick

Abstract

Though molecular devices exhibiting potentially useful electrical behavior have been demonstrated, a deep understanding of the factors that influence charge transport in molecular electronic junctions has not yet been fully realized. Recent work has shown that a mechanistic transition occurs from direct tunneling to field emission in molecular electronic devices. The magnitude of the voltage required to enact this transition is molecule-specific, and thus measurement of the transition voltage constitutes a form of spectroscopy. Here we determine that the transition voltage for a series of alkanethiol molecules is invariant with molecular length, consistent with other spectroscopic measurements of the barrier height for alkyl junctions. We further show that the transition voltage of a conjugated molecule depends directly on the manner in which the conjugation pathway has been extended. Finally, by examining the transition voltage as a function of contact metal, we show that this technique can be used to determine the dominant charge carrier for a given molecular junction.
Citation
Nature Nanotechnology

Keywords

molecular electronics, nanotechnology

Citation

Beebe, J. , Kim, B. , Frisbie, C. and Kushmerick, J. (2008), Probing Charge Transport in Molecular Electronic Junctions With Transition Voltage Spectroscopy, Nature Nanotechnology (Accessed May 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 16, 2008