Teague, L.
, Jurchescu, O.
, Richter, C.
, Subramanian, S.
, Anthony, J.
, Jackson, T.
, Gundlach, D.
and Kushmerick, J.
(2010),
Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
(Accessed November 21, 2024)
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Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published
Author(s)
LC Teague, Oana Jurchescu, , Sankar Subramanian, John E. Anthony, Thomas Jackson, ,
Pub Type
Talks
Citation
Issues
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Created June 22, 2010, Updated October 12, 2021