Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Pulsed inductive microwave magnetometer

Published

Author(s)

Anthony B. Kos, Thomas J. Silva, Pavel Kabos

Abstract

We describe the apparatus, software, and measurement procedures for a pulsed inductive microwave magnetometer (PIMM). PIMM can measure the dynamical properties of materials used in recording heads for magnetic storage applications and it can be used as a general magnetodynamics diagnostic tool. PIMM uses a coplanar waveguide as both a source of fast pulsed magnetic fields and as an inductive flux sensor. Magnetic filed pulses are provided by a 10 V, 55 ps risetime pulse generator; a 20 GHz digital sampling oscilloscope is used to acquire the fast pulse data; and orthogonal Helmholtz pairs provide the bias and saturating fields required for the measurement. The system can measure dynamical behavior as a function of several variables, including applied magnetic bias filed, magnetic pulsed filed amplitude and width, and sample orientation. Using a fast Fourier transform, PIMM can determine the frequency dependence of the complex magnetic permeability, as well as the step and impulse responses of the magnetic system. Data from 50 nm Ni-Fe and rare-earth-doped Ni-Fe thin-films are presented.
Citation
Review of Scientific Instruments
Volume
73
Issue
10

Keywords

dynamical behavior, magnetic permeability, magnetodynamic, magnetodynamic permeameter, Ni-Fe films, permeameter

Citation

Kos, A. , Silva, T. and Kabos, P. (2002), Pulsed inductive microwave magnetometer, Review of Scientific Instruments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30796 (Accessed November 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 30, 2002, Updated October 12, 2021