Lewis, R.
(1997),
Relative Permittivity Measurement of Square Copper-Laminated Substrates Using the Full Sheet Resonance Technique, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed January 13, 2025)
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Relative Permittivity Measurement of Square Copper-Laminated Substrates Using the Full Sheet Resonance Technique
Published
Author(s)
R L. Lewis
Citation
NIST Interagency/Internal Report (NISTIR) - 5053
Report Number
5053
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1996, Updated October 12, 2021