Requirements for the Development of Bacillus Anthracis Spore Reference Materials Used to Test Detection Systems

Published

May 1, 2006

Author(s)

Jamie L. Almeida, Lili Wang, Jayne B. Morrow, Kenneth D. Cole

Abstract

Bacillus anthracis spores have been used as biological weapons and the possibility of their further use requires surveillance systems that can accurately and reliably detect their presence in the environment. These systems must collect samples, process the samples, and detect the spores. Suitable reference materials will allow the testing of each of these steps to determine the sensitivity and specificity of the detection systems. The development of uniform and well-characterized reference materials will allow the comparison of different devices and technologies as well as assure the continued performance of detection systems. This paper discusses the special requirements of reference materials for Bacillus anthracis spores that could be used for testing detection systems. The detection of Bacillus anthracis spores is based on recognition of specific characteristics (markers) on either the spore surface or in the nucleic acids (DNA). We have reviewed the specific markers and their relevance to characterization of reference materials. We have also included the approach for the characterization of candidate reference materials that we are developing at the NIST laboratories. Additional applications of spore reference materials would include testing sporicidal treatments, techniques for sampling the environment and remediation of spore-contaminated environments.

Citation

Journal of Research (NIST JRES) -

Volume

111

Issue

3

NIST Pub Series

Journal of Research (NIST JRES)

Pub Type

NIST Pubs

Keywords

anthrax, Bacillus anthracis, bacteria, biological threat, detection, reference materials, spores

Citation

Almeida, J. , Wang, L. , Morrow, J. and Cole, K. (2006), Requirements for the Development of Bacillus Anthracis Spore Reference Materials Used to Test Detection Systems, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed November 21, 2024)