Penczek, J.
, Kelley, E.
and Kim, S.
(2008),
Robustness of display hemispherical reflectance measurement apparatus, Proceedings of 8th International Meeting on Information Display, Oct. 13-17, 2008, Ilsan, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33184
(Accessed January 15, 2025)
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Robustness of display hemispherical reflectance measurement apparatus
Published
Author(s)
, , Seugkwan Kim
Abstract
Reflection measurements are critical to the evaluation of display performance under ambient illumination conditions. Various hemispherical reflection methods are evaluated for their suitability and robustness across display technologies. The standard integrating sphere method is compared to a sampling sphere apparatus.Proceedings Title
Proceedings of 8th International Meeting on Information Display, Oct. 13-17, 2008
Conference Dates
October 13-17, 2008
Conference Location
Ilsan
Pub Type
Conferences
Download Paper
Keywords
diffuse reflectance, display refraction measurements, display measurements, integrating sphere, sampling sphere
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 1, 2008, Updated February 19, 2017