Unguris, J.
, Hembree, G.
, Pierce, D.
and Celotta, R.
(1985),
Scanning Electron Microscopy with Secondary Electron Spin Polarization Analysis: A New Probe of Magnetic Microstructure, 45th Annual Conference on Physical Electronics, Milwaukee, WI, USA
(Accessed December 26, 2024)
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Scanning Electron Microscopy with Secondary Electron Spin Polarization Analysis: A New Probe of Magnetic Microstructure
Published
Author(s)
, G Hembree, ,
Conference Dates
January 1, 1985
Conference Location
Milwaukee, WI, USA
Conference Title
45th Annual Conference on Physical Electronics
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1984, Updated October 12, 2021