U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1 - 25 of 1326

Three-dimensional characterization of particle size, shape, and internal porosity for Apollo 11 and Apollo 14 lunar regolith and JSC-1A lunar regolith soil simulant

June 8, 2024
Author(s)
Jay Goguen, Andrew Sharits, Ann Chiaramonti Debay, Thomas V. Lafarge, Edward Garboczi
Samples of soils collected by the Apollo 11 mission (10084) and the Apollo 14 mission (14163) were obtained from the NASA CAPTEM program. The particle size, shape, and internal porosity were characterized in three dimensions (3D) using a combination of X

In situ observation of the multistep process of cold sintering

May 15, 2024
Author(s)
Russell Maier
A compact cold sintering stage was constructed to densify ceramic samples in capillary tubes for the purpose of conducting in situ experiments designed to elucidate fundamental cold sintering mechanisms. The stage was used to successfully densify samples

In situ Probing of Interfacial Roughness and Transient Phases During Ceramic Cold Sintering Process

October 15, 2023
Author(s)
Fan Zhang, Russell Maier, Igor Levin, Andrew J. Allen, Jun-Sang Park, Peter Kenesei, Ivan Kuzmenko, Jan Ilavsky, Pete Jemian
The ceramic cold sintering process (CSP) offers an eco-friendly approach to producing fully dense ceramics at low temperatures. However, an incomplete mechanistic understanding hinders its optimization and widespread adoption. In this study, we analyze the

Electron Paramagnetic Resonance Study of Carbonated Hydroxyapatite Synthesized through Calcium Phosphate Cements

August 5, 2022
Author(s)
Alline F. Myers, Shozo Takagi, Stanislav Frukhtbeyn, Laurence Chow, Veronika Szalai, Lonnie Cumberland, Ileana Pazos, Eaman Karim
Ionizing radiation-induced paramagnetic defects in calcified tissues like tooth enamel are indicators of irradiation dose. Hydroxyapatite (HA), the principal constituent in these materials, incorporates a variety of anions (CO32, F, Cl, SiO44 ) and

Analytical and Numerical Analyses for Two-Dimensional Stress Transfer

October 12, 2021
Author(s)
C H. Hsueh, P Becher, Lin-Sien H. Lum, Stephen A. Langer, W Carter
Both analytical modeling and numerical simulations were performed to analyze the stress transfer in platelet-reinforced composites in a two-dimensional sense. In the two-dimensional model, an embedded elongate plate bonded to a matrix along its length

c-Axis Oriented Epitaxial BaTiO 3 Films on (001) Si

October 12, 2021
Author(s)
V Vaithyanathan, J Lettieri, W Tian, A Kochhar, H Ma, A Sharan, A Vasudevarao, J. A. Aust, Y Li, Long-Qing Chen, P Zschack, Joseph Woicik
c-axis oriented epitaxial films of the ferroelectric BaTiO3 have been grown on (001) Si by reactive molecular-beam epitaxy (MBE). The orientation relationship between the film and substrate is (001) BaTiO3 // (001) Si and [100] BaTiO3 // [110] Si. The

Characterization of New 5M and 7M Polytypes of Niobia-Doped Ca 2 Ta 2 O 7

October 12, 2021
Author(s)
I E. Grey, Robert S. Roth, W G. Mumme, J Planes, Leonid A. Bendersky, C Li, J Chenavas
Two new calcium tantalate polytypes have been prepared in the system Ca2Ta2O7-Ca2Nb2O7. Their structures have been determined and refined using single crystal X-ray diffraction data and powder neutron diffraction data, and their dielectric properties have

Chemical Analysis of HfO 2 / Si (100) Film Systems Exposed to NH 3 Thermal Processing

October 12, 2021
Author(s)
Patrick S. Lysaght, Joseph Woicik, Daniel A. Fischer, Gennadi Bersuker, Joel Barnett, Brendan Foran, Hsing-Huang Tseng, Raj Jammy
Nitrogen incorporation in HfO2/SiO2 films utilized as high-k gate dielectric layers in advanced metal-oxide field-effect transistors (MOSFETs) has been investigated. Thin HfO2 blanket films deposited by atomic layer deposition on either SiO2 or NH3 treated

Comparative Dielectric Behavior of PBFe 1/2 Ta 1/2 O 3 and NaNbO 3 :Gd Relaxor-Like Crystals

October 12, 2021
Author(s)
I P. Raevski, S A. Prosandeev, U Waghmare, V V. Eremkin, V G. Smotrakov, V A. Shuvaeva
Experimental data obtained for PBFe 1/2Ta 1/20 3 (PFT) and NaNbO 3:Gd (NaNbGd) single crystals show a diffused dielectric permittivity peak that is inherent to relaxor ferroelectrics. However some deviations from the normal relaxor properties were also

Displacive Phase Transition in SrTiO 3 Thin Films Grown on Si(001)

October 12, 2021
Author(s)
F S. Aguirre-Tostado, A Herrera-Gomez, Joseph Woicik, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Zschack
Polarization dependent x-ray absorption fine structure measurements performed at the Ti K edge together with x-ray diffraction have been used to study the local structure in SrTiO3 thin films grown epitaxially on Si(001). SrTiO3 layers on Si(001) are found

Dopant Location Identification in Nd 3+ -Doped TiO 2 Nanoparticles

October 12, 2021
Author(s)
W Li, A I. Frenkel, Joseph Woicik, C Ni, S I. Shah
Doping large bandgap semiconductors is typically done in order to enhance photocatalytic, photovoltaic and other chemical and optoelectronic properties. The identification of dopant position and its local environment is essential to exploring the doping
Displaying 1 - 25 of 1326