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Displaying 251 - 275 of 717

A 100 Tohm Guarded Hamon Transfer Standard

August 24, 2014
Author(s)
Dean G. Jarrett, Edward O'Brien, Marlin E. Kraft
Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and guard resistor

Photonic-assisted Endoscopic Analysis of Guided W-band Pulses

August 24, 2014
Author(s)
Jeffrey A. Jargon, DongJoon Lee, JaeYong Kwon
We present a photonic-assisted time-domain measurement technique for exploring millimeter-wave propagation through a W-band waveguide. The electric fields, guided inside a rectangular waveguide, are sampled using a sub-millimeter-scale electro-optic probe

Broadband Rydberg Atom Based Self-Calibrating RF E-field Probe

August 16, 2014
Author(s)
Christopher L. Holloway, Joshua A. Gordon, Steven R. Jefferts, Thomas P. Heavner
We present a significantly new approach for an electric (E) field probe. The probe is based on the interaction of RF-fields with Rydberg atoms, where alkali atoms are excited optically to Rydberg states and the applied RF-field alters the resonant state of

Characterizing a Device's susceptibility to broadband signals: A case study

August 4, 2014
Author(s)
Jason B. Coder, John M. Ladbury, David Hunter
It is common for electronic devices to be tested for their susceptibility to radiated signals they may be exposed to during their normal operation. A reverberation chamber is well suited to perform this type of testing because it can expose the device

Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields

July 23, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, James C. Booth, David R. Novotny, James A. Liddle, Pavel Kabos
The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To

Energy Harvesting from the Human Leg Motion

July 23, 2014
Author(s)
Kamran Sayrafian, Antonio M. Possolo, Nathalie Yarkony
Kinetic energy harvested from the human body motion seems to be one of the most attractive and convenient solution for wearable wireless sensors in healthcare applications. Due to their small size, such sensors typically have a very limited battery-powered

Colored Noise and Regularization Parameter Selection for Waveform Metrology

July 8, 2014
Author(s)
Andrew M. Dienstfrey, Paul D. Hale
We study six regularization parameter selection algorithms applied to deconvolution problems relevant for characterization of high-speed communication measurement systems. In particular we investigate the performance of these selectors in the presence of

Inter-BAN Interference Mitigation: A Correlated Equilibrium Perspective

June 13, 2014
Author(s)
Vladimir Marbukh, Kamran Sayrafian, Martina Barbi, Mehdi Alasti
A Body Area Network (BAN) is a wireless network of wearable or implantable computing devices. A BAN typically consists of several miniaturized radio-enabled body sensor/actuator that communicate with a single coordinator. Medical applications usually

A Prescription for THz Transistor Characterization

April 4, 2014
Author(s)
Dylan F. Williams
Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter

Calibrations for Millimeter-Wave Silicon Transistor Characterization

March 1, 2014
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for

A four-pixel single-photon pulse-position array fabricated from WSi superconducting nanowire single- photon detectors

February 3, 2014
Author(s)
Varun B. Verma, Robert D. Horansky, Francesco Marsili, Jeffrey Stern, Matthew Shaw, Adriana E. Lita, Richard P. Mirin, Sae Woo Nam
We demonstrate a scalable readout scheme for an infrared single-photon pulse-position camera consisting of WSi superconducting nanowire single-photon detectors. For an N × N array, only 2 × N wires are required to obtain the position of a detection event

Analysis for Dynamic Metrology

January 30, 2014
Author(s)
Andrew M. Dienstfrey, Paul D. Hale
Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may be used

Greedy Backpressure Routing for Smart Grid Sensor Networks

January 13, 2014
Author(s)
Hamid Gharavi
In this paper, a greedy backpressure routing protocol is proposed for multigate mesh networks. This protocol evaluates the greedy backpressure metric (GBM) value of mesh points and routes packets in the direction of the steepest gradient. The GBM value is

10 TOhm and 100 TOhm High Resistance Measurements at NIST

September 25, 2013
Author(s)
Dean G. Jarrett, Marlin E. Kraft
The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used to provide multiple

On the Link Between Insertion Loss and Lower Bound of Efficiency

August 9, 2013
Author(s)
Levon Barsikyan, Jason Coder, Mark Golkowski, John M. Ladbury
We investigate the effect of chamber loss on the recently developed 2-port antenna model and the associated method of determining antenna efficiency. The loss in the reverberation chamber was controlled using microwave absorbing foam creating four

Hybrid quantum-well system for wavelength-channel selection

June 28, 2013
Author(s)
Lu Deng, Edward W. Hagley, Chengjie Zhu
We consider a hybrid quantum-well structure consisting of regions whose properties alternate between active Raman gain and electromagnetically induced transparency. We present both analytical and numerical results that indicate a large light beam defection

Traceability for Aerosol Electrometer in the fA Range

June 1, 2013
Author(s)
Dean G. Jarrett, Miles Owen
Described here are the configurations and procedures used to provide traceability to electrical standards for an aerosol electrometer calibration in the range ± 20 fA to ± 40 fA. The technique used here simulated the condition of a current induced when

The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes

May 6, 2013
Author(s)
Nicholas Paulter, John Jendzurski, Mike McTigue, Bill Hagerup, Thomas E. Linnenbrink
The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

April 25, 2013
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is
Displaying 251 - 275 of 717