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Displaying 276 - 300 of 1326

Structural Ceramics Database Update (April 2003)

February 19, 2017
Author(s)
R G. Munro, C P. Sturrock
An update of the NIST Standard Reference Database Number 30, the Structural Ceramics Database, has been completed. This update, designated SCD Update (April 2003), increases the number of source entries by 100 citations and increases the total number of

Subsolidus Phase Equiibria of the 2223 (Bi:Sr:Ca:Cu) Phase at 840 C to 850 C in Air

February 19, 2017
Author(s)
Winnie Wong-Ng, Lawrence P. Cook, F Jiang, L Swartzendruber, P Sastry
The subsolidus phase equilibria involving the Bi-2223(Bi 2Sr 1.9Ca 2.1Cu 3O 10+x) phase in the Bi-Sr-Ca-Cu-O system (BSCCO) were investigated at 840-850The subsolidus phase equilibria involving the Bi-2223(Bi2Sr1.9Ca2.1Cu3O10+x) phase in the Bi-Sr-Ca-Cu-O

Subsolidus Phase Relationships of the BaO-R 2 O 3 -CuO z (R=Tm and Yb) Systems Under Carbonate-Free Conditions at p o2 = 100 Pa, and T = 750 Degree Celcius and 810 Degree Celcius

February 19, 2017
Author(s)
Winnie Wong-Ng, Zhi Yang, Lawrence P. Cook
For applications of phase equilibria to coated conductor processing, phase diagrams constructed under carbonate-free conditions should be employed. Using special apparatus and a procedure for preparing carbonate-free precursors based on BaO, phase diagrams

Technology Trends Assessment - Thin Film Thermal Conductivity Measurement

February 19, 2017
Author(s)
A Feldman
The purpose of this document is to propose a standard procedure for measuring the thermal conductivity of insulating thin films on silicon substrates. The initial part of the assessment is a review of several measurement methods that have been used to

The 102nd Annual Meeting of the American Ceramic Society

February 19, 2017
Author(s)
Winnie Wong-Ng
Gateway to the New Millennium was the theme of the 102nd annual meeting of the American Ceramic Society which took place in St. Louis, Missouri from April 29 to May 3, 2000. A brief description of both the scientific and social program of this meeting is

The 1999 Materials Research Society (MRS) Fall Meeting

February 19, 2017
Author(s)
Winnie Wong-Ng
The 1999 Material Research Society Fall Meeting took place in Boston Copley Plaza from November 26 to December 3. This was the first time that MRS has used the spacious Hynes Convention Center as the primary meeting site, with the Marriott Hotel as an

The 48th Annual Denver X-Ray Conference

February 19, 2017
Author(s)
Winnie Wong-Ng
The 48th Annual Denver X-ray Conference took place at Sheraton Steamboat Resort, Colorado, from August 2-6, 1999. This meeting was well attended, with a combined number of 650 conference attendees and exhibitors. It was supported by the International

The Effect of Plowing on Nanofriction

February 19, 2017
Author(s)
Stephen M. Hsu, Z C. Ying
Development of low friction surfaces has become an important issue for the development of reliable devices with moving components. The common way to measure nanofriction is to use a sharp tip sliding on a sample surface. High contact pressure at the tip

The Speed, Grain Boundary Morphology, and Composition Changes Resulting from DIGM

February 19, 2017
Author(s)
John W. Cahn, C M. Elliott, P C. Fife, O Penrose
We use the equations for steady-state diffusion-induced grain boundary motion (DIGM), derived from our phase-field model, [17] to predict the grain boundary morphology and speed of DIGM, as well as the resulting compositions profiles, when the specimen

Thermal Diffusivity of AIN Using the Photothermal Deflection Technique

February 19, 2017
Author(s)
E J. Gonzalez
The thermal conductivity of AIN specimens doped with Y2O3(5 wt.%) was determined using the photothermal deflection technique. The results agree within 10% of measurements previously made using the laser flash method. Thermal measurements on as-fired thin

Thermodynamics and Phase Diagrams

February 19, 2017
Author(s)
Ursula R. Kattner
Thermodynamics is a field of physics and chemistry. It uses mathematics to describe changes in energy and entropy (disorder) of a material that is subject to mechanical, thermal or chemical action. It is most frequently used to describe the conditions that

Transient Creep Cavity Growth in Structural Ceramics

February 19, 2017
Author(s)
A F. Bower, Tze J. Chuang
Long-term service life of a load-bearing ceramic component such as a turbine blade atelevated temperatures is often controlled by the rates of nucleation and growth of creepcavities at grain junctions and interfaces within the microstructure of the

Vapor Pressure and Thermal Stability of MgB 2 at 0.1 mPa Total Pressure

February 19, 2017
Author(s)
Lawrence P. Cook, R Klein, Winnie Wong-Ng
The vapor pressure of Mg(g) over MgB 2(cr) for the reaction 2 MgB 2(cr) Mg(g)+MgB 4(cr) has been measured thermogravimetrically from 900 degrees celsius to 1100 degrees celsius at 0.1 mPa(1 atm) total pressure using a modified Knudsen effusion method and

Versatile USAXS (Bonse-Hart) Facility for Advanced Materials Research

February 19, 2017
Author(s)
J Ilavsky, P Jemain, Andrew J. Allen, Gabrielle G. Long
The USAXS facility at UNICAT Sector 33 at the Advanced Photon Source (APS) is a world-class resource for advanced materials research emphasizing full-range charactrization of nanometer-scale to micrometer-scale microstructures. Receiving photons from an

Workshop on Purity and Dispersion Measurement Issues of Single Wall Carbon Nanotubes (SWCNTs)

February 19, 2017
Author(s)
Stephen W. Freiman, Richard R. Cavanagh, C K. Montgomery, Thomas J. Shaffner, S Arepalli, B Files, P Nikolaev
This document is an executive summary of a workshop organized jointly by the National Aeronautics and Space Administration, Lyndon B. Johnson Space Center (NASA/JSC) and the National Institute of Standards and Technology (NIST) was held on May 27-29, 2003

X-Ray Absorption Fine-Structure Determination of Ferroelectric Distortion in SrtiO 3 Thin Films grown on Si(001)

February 19, 2017
Author(s)
Joseph Woicik, F S. Aguirre-Tostado, A Herrera-Gomez, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Zschack, P Pianetta
Polarization-dependent x-ray absorption fine structure together with x-ray diffraction have been used to study the local structure in SrTiO 3 thin films grown on Si(001). Our data indicate that below a critical thickness of approximately 80 , the in-plane
Displaying 276 - 300 of 1326