U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 451 - 475 of 1383

First Steps Towards Small Arrays of Mo/Au Microcalorimeters

December 1, 2000
Author(s)
J. Olsen, E. C. Kirk, K. Thomsen, B. van den Brandt, Ph. Lerch, L. Scandella, A. Zehnder, S. Mango, H. R. Ott, Martin Huber, Gene C. Hilton, John M. Martinis
We are developing small arrays of microcalorimeters based on transition edge sensors made with Mo/Au bilayers deposited on silicon nitride membranes and Au absorbers. The superconducting transition of the bilayers is adjusted to be around 130 mK with a

Microcalorimeter Energy Dispersive X-ray Spectrometer for Low Voltage Microanalysis

November 1, 2000
Author(s)
David A. Wollman, John M. Martinis, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, Martin Huber, Dale Newbury
Improved x-ray detector technology continues to be a critical metrological need in the semiconductor industry for contaminant particle analysis 1,2 and for high-spatial-resolution x-ray microanalysis using low-beam-voltage field-emission scanning electron

SQUIDs Past, Present, and Future: A Sympsium in Honor of Jim Zimmerman

October 1, 2000
Author(s)
Richard L. Kautz
The symposium on SQUIDs Past, Present, and Future was held at the National Institute of Standards and Technology in Boulder, Colorado on November 15, 1997 to celebrate the career of James E. Zimmerman. As a member of a team at the Ford Scientific

Comparison of Elemental Detection Using Microcalorimetry, SIMS, AES and EDS (SEM, STEM, and TEM)

August 1, 2000
Author(s)
C. B. Vartuli, F. A. Stevie, David A. Wollman, M. Antonell, R. B. Irwin, J. M. McKinley, T L. Shofner, B. M. Purcell, S. A. Anderson, Bobby To
Cu contamination has become a larger concern as more semiconductor fabrication facilities switch from aluminum to Cu interconnects. The resolution limits of several analytical tools are compared to determine the optimum analysis methods for detecting Cu

Exclusion Limits on the WIMP-Nucleon Scattering Cross-Section from the Cryogenic Dark Matter Search

January 1, 2000
Author(s)
S. R. Golwala, R. Abusaidi, D. S. Akerib, P. D. Barnes, D. B. Bauer, A. Bolozdynya, P. Brink, B. Cabrera, D. O. Caldwell, J. P. Castle, R. M. Clarke, P. Colling, M. B. Crisler, A. Da Silva, A. K. Davies, R. Dixon, S. Eichblatt, Kent D. Irwin, R. J. Gaitskell, E. E. Haller, J. Hellmig, Martin Huber, J. Jochum, F. P. Lipschultz, John M. Martinis, Sae Woo Nam, J. Nelson, B. Neuhauser, T. A. Perera, M. Perillo-Issac, R. R. Ross, T. Saab, B. Sadoulet, R. W. Schnee, P. Shestople, T. Shutt, Amy Smith, A. H. Sonnenschein, A. L. Spadafora, S. Yellin, B. A. Young
The Cryogenic Dark Matter Search (CDMS) employs massive ionization- and phonon-mediated detectors to search for WIMPs via their elastic scattering interactions with nuclei while discriminating against interactions by other background particles. Limits on
Displaying 451 - 475 of 1383