U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 51 - 63 of 63

Writing Guidelines to Develop an Memorandum of Understanding for Interoperable Automated Fingerprint Identification Systems

May 14, 2013
Author(s)
Susan M. Ballou, Michael Garris, Anthony Clay, Joi Dickerson, Peter T. Higgins, Lisa Jackson, Joe Morrissey, Beth Owens, Joe Polski, Janet Hoin, Leo Norton, Melissa Taylor
This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the

March 2013 SRM Spotlight

February 25, 2013
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition

February 15, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, Michael Gaitan, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property

Fourth NIST Workshop on Carbon Nanotubes: Chirality Measurements

January 30, 2013
Author(s)
Jeffrey A. Fagan
On September 23rd and 24th, 2010, the National Institute of Standards and Technology (NIST) hosted the fourth in a series of workshops addressing measurement needs for single wall carbon nanotubes (SWCNTs). Attendees representing an international community

User's Guide for SRM 2494 and 2495: The MEMS 5-in-1, 2011 Edition

September 6, 2011
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a standard reference device sold as a NIST Standard Reference Material (SRM) that contains MEMS test structures on a test chip. The two SRM chips (2494 and 2495) provide for both dimensional and material

Certification of Three NIST Renewal Soil Standard Reference Materials(R) for Element Content: SRM 2709a San Joaquin Soil, SRM 2710a Montana Soil I, and SRM 2711a Montana Soil II

June 1, 2010
Author(s)
Elizabeth A. Mackey, Christopher S. Johnson, Richard M. Lindstrom, Stephen E. Long, Anthony F. Marlow, Karen E. Murphy, Rick L. Paul, Rachel S. Popelka-Filcoff, Savelas A. Rabb, John R. Sieber, Rabia Oflaz, Bryan E. Tomlin, Laura J. Wood, James H. Yen, Lee L. Yu, Rolf L. Zeisler, S. A. Wilson, M. G. Adams, Z. A. Brown, P. L. Lamothe, J. E. Taggart, C. Jones, J. Nebelsick
For the past 20 y, the National Institute of Standards and Technology has provided three soil Standard Reference Materials certified for element content: SRM 2709 San Joaquin Soil (Baseline Trace Element Concentrations); SRM 2710 Montana Soil I (Highly

SRM NIST Standard Reference Materials Catalog, January 2010

January 4, 2010
Author(s)
Regina R. Montgomery, Joan C. Sauerwein
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100 individual reference materials produced and sold by NIST, each with carefully assigned values

Certification of a Polystyrene Synthetic Polymer, SRM 2888

November 1, 2003
Author(s)
Charles M. Guttman, William R. Blair, B M. Fanconi, R J. Goldschmidt, William E. Wallace, S Wetzel, David L. VanderHart
The certification of a polystyrene standard reference material, SRM 2888, is described. The M w of SRM 2888 was determined by light scattering to be 7.19 x 10 +3 g/mol with a sample standard deviation of 0.14 x 10 +3 g/mol. A combined expanded uncertainty
Displaying 51 - 63 of 63