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Search Publications

NIST Authors in Bold

Displaying 101 - 125 of 73766

Assessing support structures for early career researchers at NIST

August 29, 2025
Author(s)
Justyna Zwolak, Robert Dalka
This report summarizes the findings of the workforce preparation assessment initiative at the National Institute of Standards and Technology (NIST) using the Aspects of Postdoctoral Researcher Experience Scale survey. It provides an assessment of the

Accurate, precise pressure sensing with tethered optomechanics

August 28, 2025
Author(s)
Olivia Green, Yiliang Bao, John R. Lawall, Jason Gorman, Daniel Barker
We show that optomechanical pressure sensors with characterized density and thickness can achieve uncertainty as low as 1.1 % via comparison with a secondary pressure standard. The agreement between the secondary standard and our optomechanical sensors is

Methodology for Characterizing Network Behavior of Internet of Things Devices

August 28, 2025
Author(s)
Paul Watrobski, Murugiah Souppaya, Joshua Klosterman, William C. Barker, Jeffrey Marron, Blaine Mulugeta
This report describes an approach to capturing and documenting the network communication behavior of Internet of Things (IoT) devices. From this information, manufacturers, network administrators, and others can create and use files based on the

Material Needs and Measurement Challenges for Advanced Semiconductor Packaging: Understanding the Soft Side of Science

August 27, 2025
Author(s)
Ran Tao, Polette Centellas, Stian Romberg, Anthony Kotula, Gale Holmes, Amanda Forster, Christopher Soles, Bob Allen, Edvin Cetegen, William Chen, Jeff Gotro, Mark Poliks
This perspective builds upon insights from the National Institute of Standards and Technology (NIST)-organized workshop, "Materials and Metrology Needs for Advanced Semiconductor Packaging Strategies," held at the 35th annual Electronics Packaging

Materials discovery in combinatorial and high-throughput synthesis and processing: A new Frontier for SPM

August 27, 2025
Author(s)
Boris Slautin, Yungtao Liu, Kamyar Barakati, Yu Liu, Reece Emery, Seungbum Hong, Astita Dubey, Vladimir Shvartsman, Doru Lupascu, Sheryl Sanchez, Mahshid Ahmadi, Yunseok Kim, Evgheni Strelcov, Keith Brown, Philip Rack, Sergei Kalinin
For over three decades, scanning probe microscopy (SPM) has been a key method for exploring material structures and functionalities at nanometer and often atomic scales in ambient, liquid, and vacuum environments. Historically, SPM applications have

Rayleigh-Taylor instability in a binary quantum fluid

August 27, 2025
Author(s)
Ian Spielman, Gretchen Campbell, Stephen Eckel, Yanda Geng, Junheng Tao, Mingshu Zhao, Shouvik Mukherjee
We experimentally investigated the Rayleigh-Taylor instability in an immiscible homogeneous Bose-Einstein condensate (BEC) in different spin states. A magnetic field gradient force pushes two BECs together and induces instability of the interface, leading

Certification of 3180 Series Standard Reference Materials(R) Anions in Solution

August 26, 2025
Author(s)
Brian Lang, Thomas Vetter, John Molloy, Antonio Possolo
The 3180 series Standard Reference Materials (SRMs) are single anion solutions intended for use as primary calibration standards for the quantitative determination of a single anion and are a key link in the traceability chain for analysis measurements of

GRANAD - Simulating GRAphene nanoflakes with ADatoms

August 26, 2025
Author(s)
David Dams, Miriam Kosik, Marvin Muller, Abhishek Ghosh, Antton Babaze, Julia Szczuczko, Garnett Bryant, Andres Ayuela, Carsten Rockstuhl, Marta Pelc, Karolina Slowik
GRANAD is a new program based on the tight-binding approximation to simulate optoelectronic properties of graphene nanoflakes and Su–Schrieffer–Heeger (SSH) chains with possible adatom defects under electromagnetic illumination. Its core feature is the

Direct detection of the ? 8.4 eV internal conversion energy of 229mTh embedded in a superconducting nanowire

August 25, 2025
Author(s)
Galen O'Neil, Kjeld Beeks, Eric Hudson, David Ray Leibrandt, Marion Mallweger, Sae Woo Nam, Sayan Patra, Gil Porat, Dileep Venkatarama Reddy, Thorsten Schumm, Stephen Schoun, Benedict Seiferle, Christian Schneider, Lars von der Wense, Peter Thirolf, Varun Verma, Jun Ye, Chuankun Zhang
We report on a direct measurement of the ∼ 8.4 eV nuclear excitation energy of the isomeric first excited state 229mTh via the internal conversion (IC) decay channel. Thermalized and mass-filtered recoiling 229mTh ions from 233U α decay are delivered to

Direct measurement of the 3P0 clock state natural lifetime in 87Sr

August 24, 2025
Author(s)
Kyle Beloy, Jonathan Dolde, Dhruva Ganapathy, Xin Zheng, Shuo Ma, Shimon Kolkowitz
Optical lattice clocks based on the narrow transition between (5s2)1S0 -(5s5p)3P0 levels in neutral strontium (Sr) are among the most precise and accurate measurement devices in existence. Although this transition is completely forbidden by selection rules

From ultra-noisy to ultra-stable: optimization of the optoelectronic laser lock

August 24, 2025
Author(s)
Takuma Nakamura, Yifan Liu, Naijun Jin, Haotian Cheng, Charles McLemore, Nazanin Hoghooghi, Peter Rakich, Franklyn Quinlan
We demonstrate thermal noise-limited direct locking of a semiconductor DFB laser to a sub-1 mL volume, ultrastable optical cavity, enabling extremely compact and simple ultrastable laser systems. Using the optoelectronic laser locking method, we realize

Ion Coulomb crystals: an exotic form of condensed matter

August 24, 2025
Author(s)
Giovanna Morigi, John Bollinger, Michael Drewsen, Daniel Podolsky, Efrat Shimshoni
Wigner crystals formed by laser-cooled ions in traps are unconventional condensed matter systems, characterized by interparticle distances of several micrometers and energy scales on the order of meV. Their crystalline structure emerges from the interplay

EVALUATING IDENTITY LEAKAGE IN SPEAKER DE-IDENTIFICATION SYSTEMS

August 21, 2025
Author(s)
Seungmin Seo, Oleg Aulov, Afzal Godil, Kevin Mangold
Speaker de-identification aims to conceal a speaker's identity while preserving intelligibility of the underlying speech. We introduce a benchmark that quantifies residual identity leak- age with three complementary error rates: equal error rate (EER)

Evaluating the Impact of Changes to the Internal Publication Review Policy at NIST

August 21, 2025
Author(s)
Juan Fung, Michael Hall, Jennifer Helgeson, Alden Dima, Anne Andrews, Jennifer Benkstein
This report presents the design and methodology of a survey conducted to evaluate the impact of changes to the organizational publication review policy at the National Institute for Standards and Technology (NIST). The purpose of the survey is to collect

Kelvin probe force microscopy under ambient conditions

August 21, 2025
Author(s)
Amirhossein Zahmatkeshsaredorahi, Ruben Millan-Solsona, Devon Jakob, Liam Collins, Xiaoji Xu
Kelvin Probe Force Microscopy (KPFM), a technique derived from Atomic Force Microscopy (AFM), provides nanometer-scale spatial resolution for mapping surface potential or work function differences across material systems. It serves as a powerful tool for

Considerations for Implementing Morph Detection in Operations

August 18, 2025
Author(s)
Mei Ngan, Patrick Grother
Morphing of face photographs present a threat to identity processes; for example, two people being able to use one passport. The threat exists in applications that allow users to submit their own photos where digital history is unknown. The threat can be
Displaying 101 - 125 of 73766
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