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NIST Authors in Bold

Displaying 176 - 200 of 3116

Measuring Ion-Pairing in Buffer Solutions with Microwave Microfluidics

June 14, 2018
Author(s)
Angela C. Stelson, Charles A. Little, Nathan D. Orloff, Christian J. Long, James C. Booth
Microwave microfluidics is an emergent technique for characterizing conductivity and permittivity of fluids and has wide-ranging applications in the materials science and biomedical fields. The electrical properties of fluids as a function of frequency can

Generalized Sheet Transition Conditions (GSTCs) for a Metascreen

May 1, 2018
Author(s)
Christopher L. Holloway
Using the multiple-scales homogenization method, we derive generalized sheet transition conditions (GSTCs) for electromagnetic fields at the surface of a metascreen---a metasurface with a ``fishnet'' structure. These surfaces are characterized by

Angle- and Delay-Dispersion Characteristics in a Hallway and Lobby at 60 GHz

April 9, 2018
Author(s)
Roy Sun, Peter B. Papazian, Jelena Senic, Camillo A. Gentile, Catherine A. Remley
In this paper, we present results from measurement data collected in a hallway and lobby up to 33 meters in line-of-sight and non-line-of-sight conditions. The data was collected using a custom double-directional 60 GHz channel sounder. By tracking the

The New Large Antenna Positioning System for Over-The-Air Testing at the National Institute of Standards and Technology

April 8, 2018
Author(s)
Jeffrey R. Guerrieri, David R. Novotny, Josh Gordon, Alexandra Curtin, Michael S. Allman, Kim Hassett, Quang Ton
This paper introduces the new Large Antenna Positioning System (LAPS) at the National Institute of Standards and Technology (NIST). For the last eight years NIST has been pioneering the use of robotics for antenna measurements. Starting with the

A new magnet design for future Kibble balances

April 4, 2018
Author(s)
Stephan Schlamminger, Shisong Li, Michael Stock
We propose a new permanent magnet system for Kibble balance experiments, which combines advantages of the magnet designs invented by the National Physical Laboratory (NPL) and by the Bureau International des Poids et Mesures (BIPM). The goal of the

Method for Determining the Electrical Shape of a Scanning Probe Microscope Tip

April 2, 2018
Author(s)
Joseph J. Kopanski, Malcolm Regan, Lin You
Knowledge of the actual electrical tip shape can be used to better understand electric field gradients measured with eSPMs and to determine the suitability of various types of conducting SPM tips for electrical measurements. For co-axially shielded tips

Examining epitaxial graphene surface conductivity and quantum Hall device stability with Parylene passivation

March 20, 2018
Author(s)
Albert F. Rigosi, Chieh-I Liu, Bi Y. Wu, Hsin Y. Lee, Mattias Kruskopf, Yanfei Yang, Heather M. Hill, Jiuning Hu, Emily G. Bittle, Jan Obrzut, Angela R. Hight Walker, Randolph E. Elmquist, David B. Newell
When it comes to the advancement of quantized Hall resistance (QHR) standards, homogeneous, single-crystal, monolayer epitaxial graphene (EG) is the most promising candidate. EG-based quantum Hall devices, though emerging as a useful tool for metrology

Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging

March 5, 2018
Author(s)
Joseph J. Kopanski, Lin You, Yaw S. Obeng
Contrast in electrostatic force microscopy (EFM) depends on the electrostatic force between the tip and sample. In the related technique, scanning Kelvin force microscopy (SKFM), contrast arises from the force due to the capacitance gradient with tip-to
Displaying 176 - 200 of 3116