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Search Publications by: David R Black (Fed)

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Displaying 26 - 50 of 93

Complementary Experimental Techniques for Multi-Scale Modeling of Plasticity

October 16, 2008
Author(s)
Lyle E. Levine, Gabrielle G. Long, David R. Black
Some recently-developed experimental techniques, such as in situ ultra-small-angle X-ray scattering (USAXS), have demonstrated a capability for measuring aspects of dislocation structure evolution that are inaccessible to other experimental methods

Investigation of Electron Hole Recombination-Activated Partial Dislocations and Their Behavior in 4H-SiC Epitaxial Layers

May 8, 2008
Author(s)
Yi Chen, Ning Zhang, M Dudley, JOSHUA CALDWELL, Kendrick Liu, ROBERT STAHLBUSH, XIANRONG HUANG, A T. Macrander, David R. Black
Electron hole recombination-activated partial dislocations in 4H silicon carbide homoepitaxial layers and their behavior have been studied using synchrotron X-ray topography and electroluminescence. Stacking faults whose expansion was activated by electron

X-Ray Topography to Characterize Surface Damage on CdZnTe Crystals

January 7, 2008
Author(s)
David R. Black, Joseph C. Woicik, Martine Duff, Douglas Hunter, Arnold Burger, Michael Groza
Synthetic CdZnTe or CZT crystals can be used for room temperature detection of ?-radiation. Structural/morphological heterogeneities within CZT, such as twinning, secondary phases (often referred to as inclusions or precipitates), and polycrystallinity can

Characterization of Spatial Heterogenieties in Detector Grade CdZnTe

December 4, 2007
Author(s)
Martine Duff, Douglas Hunter, Arnold Burger, Michael Groza, V Buliga, J Bradley, G Graham, Z Dai, N Teslich, David R. Black, H E. Burdette, A Lanzirotti
Synthetic Cd1-xZnxTe or CZT crystals are highly suitable for the room temperature-based spectroscopy of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases that are thought to consist of Te metal, can have

X-Ray Topography for Fractography of Single-Crystal Components

June 15, 2006
Author(s)
David R. Black, George D. Quinn
X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of single-crystal samples both before and after fracture. It can find strength and performance limiting surface and subsurface