Publications

Displaying 26 - 50 of 72

Temperature Measurement and Optical Path-length Bias Improvement Modifications to NIST Ozone Reference Standards

May 1, 2013

Author(s)

James E. Norris, Steven J. Choquette, Franklin R. Guenther, Joele Viallon, Philippe Moussay, Robert Wielgosz

Ambient ozone measurements in the U.S. and many other countries are traceable to a National Institute of Standards and Technology Standard Reference Photometer (NIST SRP). The NIST SRP serves as the highest level ozone reference standard in the U.S. with

Measurement of Scattering and Absorption Cross Sections of Dyed Microspheres

January 14, 2013

Author(s)

Adolfas Gaigalas, Steven J. Choquette

Measurements of absorbance and fluorescence emission were carried out on aqueous suspensions of polystyrene (PS) microspheres with a diameter of 2.5 µm. Microspheres with and without green BODIPY@ dye were measured. Placing the suspension inside an

Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240 nm and 800 nm

January 10, 2013

Author(s)

Lili Wang, Steven J. Choquette, Adolfas Gaigalas

A commercial spectrometer with a 150 mm integrating sphere (IS) detector was used to measure the scattering and absorption cross sections of polystyrene monodisperse microspheres suspended in water. Absorption measurements were performed with the sample

Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector

September 13, 2012

Author(s)

Lili Wang, Steven J. Choquette, Yu-Zhong Zhang, Victoria Karpiak, Adolfas Gaigalas

A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the extinction, one with the cuvette placed in the

Certified Transmittance Density Uncertainties for Standard Reference Materials using a Transfer Spectrophotometer

November 28, 2011

Author(s)

John C. Travis, Melody V. Smith, Steven J. Choquette, Hung-Kung Liu

Overall uncertainties are evaluated for the certification of transmittance density (absorbance referred to air) and regular spectral transmittance for solid neutral density filter Standard Reference Materials by means of a transfer spectrophotometer

Automated Spectral Smoothing with Spatially Adaptive Penalized Least-Squares

June 1, 2011

Author(s)

Aaron A. Urbas, Steven J. Choquette

A variety of data smoothing techniques exist to address the issue of noise in spectroscopic data. The vast majority, however, require parameter specification by a knowledgeable user, which is typically accomplished by trial and error. In most situations

Use of Standard Reference Material 2242 (Relative Intensity Correction Standard for Raman Spectroscopy) for Microarray Scanner Qualification

August 1, 2008

Author(s)

Mary B. Satterfield, Marc L. Salit, Steven J. Choquette

As a critical component of any microarray experiment, scanner performance has the potential to contribute variability and bias, the magnitude of which is usually not quantified. Using Standard Reference Material (SRM) 2242, certified for Raman spectral

Relative intensity correction of Raman spectrometers: NIST SRMs 2241 through 2243 for 785 nm, 532 nm, and 488 nm/514.5 nm excitation

February 1, 2007

Author(s)

Steven J. Choquette, E S. Etz, Wilbur S. Hurst, Douglas H. Blackburn, Stefan D. Leigh

SRM 2036 Near Infrared Reflection Wavelength Standard

November 1, 2005

Author(s)

David L. Duewer, Steven J. Choquette, Leonard M. Hanssen, E A. Early

Standard Reference Materials for Relative Intensity Correction of Raman Spectrometers

November 1, 2005

Author(s)

Steven J. Choquette

NIST has developed a set of transfer standards for the relative correction of the intensity axis of Raman spectrometers. Three standards, covering the most commonly used lasers have been issued, and development of a fourth standard for 1064 nm excitation

Development and Certification of NIST Standard Reference Materials for Relative Raman Intensity Calibration

April 1, 2005

Author(s)

E S. Etz, Steven J. Choquette, Wilbur S. Hurst

In the practice of analytical Raman spectroscopy, it becomes increasingly important to employ a procedure for the correction of the relative intensity of Raman spectra. The determination of the intensity response function of a Raman instrument

Rare-Earth Glass Reference Materials for Near-Infrared Spectrometry: Sources of X-Axis Location Variability

August 25, 2003

Author(s)

David L. Duewer, Steven J. Choquette, L O'Neal, James J. Filliben

Relative Intensity Correction Standards for Raman Spectroscopy for Excitation with Several Common Laser Wavelengths

July 1, 2003

Author(s)

Steven J. Choquette, Douglas H. Blackburn, E S. Etz, Wilbur S. Hurst

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