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Search Publications by: M Alkan Donmez (Fed)

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Displaying 51 - 65 of 65

Robust Optimization for Smart Machining System: An Enabler for Agile Manufacturing

November 1, 2005
Author(s)
Laurent Deshayes, Lawrence A. Welsch, Robert W. Ivester, M A. Donmez
This paper reports our efforts towards developing a mathematical and information framework for optimization of machining processes within a Smart Machining System (SMS). An SMS uses diverse integrated technologies that enable an enterprise to: (1) produce

Performance Evaluation of a Prototype Machine Tool for Machining Meso-scaled Parts

January 1, 2003
Author(s)
Bradley N. Damazo, M A. Donmez, Michael L. McGlauflin, J B. Werkmeister, Johannes A. Soons, S C. Bryant, Alex Slocum
With the increased prevalence of meso-scaled products and feature sizes, new tools are needed to bridge the gap between fabrication processes tailored for micrometer and millimeter sized features [1-4]. Compared to its traditional counterpart, a small

A Methodology for Compensating Errors Detected by Process-Intermittent Inspection

October 1, 2001
Author(s)
Herbert T. Bandy, M A. Donmez, David E. Gilsinn, Michael Kennedy, Kenneth W. Yee, Alice V. Ling, Neil D. Wilkin
This report describes principles and methodology for compensating geometric errors of machined parts due to machining processes. The error tendencies are identified by on-machine inspection of the part before the finish cut. Tool path adjustments

Embedded Power Quality Solutions for Computer Numerical Control Machine Tools

January 1, 2001
Author(s)
Bradley N. Damazo, M Stephens, Johannes A. Soons, M A. Donmez
Electric Power Research Institute (EPRI) research and testing, conducted over many years, has indicated that variations in electric power quality can negatively impact end-use equipment. This research and testing has helped to form the theory that the

SEM Sentinel - SEM Performance Measurement System

January 1, 2001
Author(s)
Bradley N. Damazo, Andras Vladar, Alice V. Ling, M A. Donmez, Michael T. Postek, Crossley E. Jayewardene
This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagnosis of the vacuum system and

Technologies for Condition-Based Maintenance of Machine Tools

January 1, 2001
Author(s)
M A. Donmez, Kari K. Harper, Kang B. Lee
NIST has embarked upon a research effort to advance the capabilities and promote the continued growth of condition-based maintenance (CBM) technologies for the discrete-parts manufacturing industry. This research is focused on providing an alternative to

Report of the NIST MEL Architecture Task Force

December 29, 2000
Author(s)
Harry A. Scott, John Evans, Steven R. Ray, E C. Teague, James S. Albus, Herbert T. Bandy, Edward J. Barkmeyer Jr., Neil Christopher, M A. Donmez, Hui-Min Huang, Albert W. Jones, Elena R. Messina, Jim G. Nell, Frederick M. Proctor, Evan K. Wallace
The NIST Manufacturing Engineering Laboratory undertook a series of internal working meetings to examine all of its architecture efforts. A survey of work was performed, and recommendations were identified. This document, initially compiled in 1999

Information Model for Machine Tool Performance Tests

November 1, 2000
Author(s)
Yung-Tsun T. Lee, M A. Donmez, Johannes A. Soons
This report specifies an information model of machine tool performance evaluation tests. The information model provides a mechanism capable of describing the properties and results of machine tool performance tests. The objective of the information model

Development of a Linear Motor Drive Testbed and Initial Thermal Behavior Results

October 1, 2000
Author(s)
Kari K. Harper, Bradley N. Damazo, M A. Donmez
The machine tool industry is moving toward using linear motors for both conventional and high speed machine tools due to many advantages: low maintenance, faster assembly times (compared with the more conventional ball screw drives), and improvements in

SEM Sentinel - SEM Performance Measurement System, Part 1

April 1, 2000
Author(s)
Alice V. Ling, Andras Vladar, Bradley N. Damazo, M A. Donmez, Michael T. Postek
This report describes the current design of a system for monitoring the performance of several major subsystems of a scanning electron microscope (SEM). The following subsystems and the associated functional parameters will be monitored. 1) Vacuum system

Development of Virtual Machine Tools

January 1, 1996
Author(s)
M A. Donmez
This paper describes a new project that is part of a program initiated by the Manufacturing Engineering Laboratory of the National Institute of Standards and Technology (NIST) to develop infrastructural tools that facilitate information-based manufacturing
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