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Search Publications by: Steven E Fick (Assoc)

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Displaying 1 - 25 of 51

Primary Sound Standard Based On Dynamic Fabry Perot Interferometry

September 21, 2023
Author(s)
Akobuije Chijioke, Richard A. Allen, Steven E. Fick, Benjamin Reschovsky, Jared Strait, Randall P. Wagner
We describe an optical sound standard in which the sound pressure is measured by using a high-finesse optical cavity to observe the induced change in the refractive index of the medium (acousto-optic effect). The optical refractive index of a substance

Optical-cavity-based primary sound standard

February 1, 2023
Author(s)
Akobuije Chijioke, Richard A. Allen, Steven E. Fick, David Long, Benjamin Reschovsky, Jared Strait, Randall P. Wagner
We propose an optical sound standard in which the sound pressure is directly measured by using an optical cavity to observe the induced change in the refractive index of air. In this method, an optical cavity is coupled with an acoustic cavity, with the

Long-term Stability of the NIST Conical Reference Transducer

December 22, 2011
Author(s)
Steven E. Fick, Thomas M. Proctor
The National Institute of Standards and Technology (NIST) Conical Reference Transducer (CRT) is designed for purposes which require frequency response characteristics much more uniform than those attainable with ultrasonic transducers conventionally used

Electrochemical Micromachining of NiTi Shape Memory Alloys with Ultrashort Voltage Pulses

December 8, 2011
Author(s)
Joseph Maurer, John Hudson, Steven E. Fick, Thomas P. Moffat, Gordon A. Shaw
Electrochemical micromachining (ECMM) with ultrashort voltage pulses has been used to fabricate microstructures on a NiTi shape memory alloy (SMA). Because of its unique properties, NiTi is a desirable material for use in various applications including

An IEEE 1451.5-802.11 Standard-based Wireless Sensor Network with Embedded WTIM

May 12, 2011
Author(s)
Eugene Song, Kang B. Lee, Steven E. Fick, Alkan Donmez
This paper introduces a reference implementation of the Institute of Electrical and Electronics Engineers (IEEE) 1451.5-802.11 standard-based wireless sensor network (WSN) developed at the National Institute of Standards and Technology (NIST). The WSN

Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses

September 8, 2009
Author(s)
Gordon A. Shaw, Joseph J. Maurer, Steven E. Fick, Thomas P. Moffat, J. J. Mallett, John L. Hudson
Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Because of

Contactless Differential Conductivity Detection

October 12, 2008
Author(s)
Gordon A. Shaw, David J. Ross, Steven E. Fick, Wyatt N. Vreeland
We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configuration

Long-term Stability of the NIST Standard Ultrasonic Source

October 1, 2008
Author(s)
Steven E. Fick
The NIST Standard Ultrasonic Source (SUS) is a system comprising a transducer capable of output power levels up to 1 W at multiple frequencies between 1 MHz and 30 MHz, and an electrical impedance-matching network that allows the system to be driven by a