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Search Publications by: Michael Gaitan (Assoc)

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Displaying 1 - 25 of 327

A Dynamic Uncertainty Protocol for Digital Sensor Networks

November 1, 2021
Author(s)
Michael Gaitan, Richard A. Allen, Jon Geist, Akobuije Chijioke
We propose a concept of the use of dynamic uncertainty to improve the accuracy and robustness of digital sensor networks. The digital smart transducer is integrated with a microcontroller that reads the binary data from the calibrated sensor, performs an

CHARACTERIZATION OF LASER DOPPLER VIBROMETERS USING ACOUSTO-OPTIC MODULATORS

December 31, 2020
Author(s)
Michael Gaitan, Jon C. Geist, Benjamin J. Reschovsky, Akobuije Chijioke
We report on a new approach to characterize the performance of a laser Doppler vibrometer (LDV). The method uses two acousto-optic modulators (AOMs) to frequency shift the light from an LDV by a known quantity to create a synthetic velocity shift that is

The role of standards in MEMS commercialization

April 1, 2015
Author(s)
Michael Gaitan
For many years, the development, creation and use of standards has played a valuable role in the successful commercialization of products, services and processes that address many industries and many applications. So it is with microelectromechanical

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler
This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard test

The Art in Science of microTAS (Editorial)

March 12, 2013
Author(s)
Michael Gaitan
The discovery of a natural phenomenon unveils a curtain of ignorance from what has always existed. However, the creation of art requires the use of materials and knowledge combined with artistic inspiration to create a work of aesthetic appeal. By this

User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition

February 15, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, Michael Gaitan, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property