April 2, 2009
Author(s)
Michael D. Indovina, Vladimir N. Dvornychenko, Elham Tabassi, George W. Quinn, Patrick J. Grother, Stephen Meagher, Michael D. Garris
The National Institute of Standards and Technology (NIST), with the cooperation of eight technology providers, performed a test of accuracy for searching latent fingerprints when using automatically extracted features and matching (AFEM). This test is