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Search Publications by: Dr. Vincent A. Hackley (Assoc)

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Displaying 226 - 250 of 305

Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis

August 1, 2006
Author(s)
George W. Mulholland, Michelle K. Donnelly, Robert C. Hagwood, S R. Kukuck, Vincent A. Hackley, D Y. Pui
The peak particle size and expanded uncertainties (95 % confidence interval) for two new particle calibration standards are measured as 101.60 nm ? 1.02 nm and 60.68 nm ? 0.59 nm. The particle samples are polystyrene spheres suspended in filtered

Growth of Nanocrystalline Ceria Studied Using a USAXS Capillary Flow-Cell

July 1, 2006
Author(s)
Vincent A. Hackley, Andrew J. Allen, P R. Jemian, J M. Raitano, S W. Chan
Nanocrystalline ceria particles, with dimensions as small as 2 nm, have been prepared at room temperature by a soft chemical route using aqueous cerium nitrate and hexamethylenetetramine (HMT) as reactants. HMT decomposes slowly in aqueous solution

Techniques for Measurements in Concentrated Systems

February 1, 2004
Author(s)
Vincent A. Hackley
Concentrated suspensions present a number of technical challenges for characterization and monitoring of the solid phase. Recent developments have provided the means to analyze many concentrated systems directly or at solids loadings more closely