Publications

Displaying 26 - 50 of 83

High Resolution X-ray Spectrometry of Solids using the Microcalorimeter X-ray Detector

September 20, 2010

Author(s)

Terrence J. Jach

We analyze here the spectrum of the AI Kα and Mg Kα x-ray lines obtained by electron excitation of a multielement glass. The spectrum was obtained in an electron beam probe using a microcalorimeter x-ray detector. With 7 eV resolution, we are able to

Characterization of Ultrathin Silicon-Oxynitride Films Using Grazing Incidence X-Ray

October 16, 2008

Author(s)

E Landree, Terrence J. Jach

This work describes the use of Grazing Incidence X-ray Photoemission Spectroscopy (GIXPS) to characterize the thickness of a silicon oxynitride ultrathin film. GIXPS utilizes the inherent optical and material properties of the film, along with the angle of

Variable Magnification of Kirkpatrick-Baez Optics for Xynchrotron X-Ray Absorption Microscopy

October 16, 2008

Author(s)

Terrence J. Jach, A S. Bakulin, S M. Durbin, J Pedulla, A T. Macrander

Hard x-ray imaging microscopy using multilayer-coated Kirkpatrick-Baez mirrors produces absorption images with one micron resolution or better when used with a low-divergence synchrotron source. Because the incident x-ray beam nearly corresponds to an

Multiplexed microcalorimeter arrays for precision measurements from microwave to gamma-ray wavelengths

August 21, 2007

Author(s)

Joel Ullom, W.Bertrand (Randy) Doriese, James A. Beall, William Duncan, S. L. Ferreira, Gene C. Hilton, Rob Horansky, Kent D. Irwin, Terrence J. Jach, John Mates, Nathan A. Tomlin, Galen O'Neil, Carl D. Reintsema, Nicholas Ritchie, Dan Schmidt, Leila R. Vale, Yizi Xu, Barry L. Zink, Andrew Hoover, Clifford R. Rudy, Derek Tournear, Duc Vo, Michael W. Rabin

Cryogenic microcalorimeters are a promising technology for ultrasensitive measurements of electromagnetic radiation from microwave to gamma-ray wavelengths. Cryogenic microcalorimeters derive their exquisite sensitivity from the minimal thermal noise at

Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy

May 1, 2006

Author(s)

Terrence J. Jach, A S. Bakulin, S M. Durbin, J Pedulla, A T. Macrander

We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler

Long-Range Strains and the Effects of Applied Field at 180 Ferroelectric Domain Walls in Lithium Niobate

February 1, 2004

Author(s)

Terrence J. Jach, S. Kim, J. A. Aust, S M. Durbin, David S. Bright

rroelectric domains with antiparallel polarization are readily induced in congruent LiNbO3 with electric fields above 240 kV/cm at room temperature. Even in the absence of external fields, these 180 walls exhibit wide regions of shear strain, of the order

Comparative Thickness Measurements of SiO 2 /Si Films for Thickness Less than 10 nm

January 1, 2004

Author(s)

Terrence J. Jach, Joseph A. Dura, Nhan V. Nguyen, J R. Swider, G Cappello, Curt A. Richter

We report on a comparative measurement of SiO 2/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to 6 nm were

Comparative Thickness Measurements of SiO 2 /Si Films for Thicknesses Less than 10 nm

January 1, 2004

Author(s)

Terrence J. Jach, Joseph Dura, Nhan Van Nguyen, J Swider, G Cappello, Curt A. Richter

Surface and Thin Film Analysis - A Compendium of Principles, Instrumentation, and Applications

April 1, 2003

Author(s)

Terrence J. Jach

Book review of Surface and Thin Film Analysis, (H. Bubert and H. Jenett, eds) published by Wiley-VCH, Weinheim, 2002.

Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si

November 1, 2002

Author(s)

Terrence J. Jach, E Landree

Grazing Incidence X-ray Photoelectron Spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry of ultrathin gate dielectric films. It combines aspects of x-ray reflectivity and conventional

Real-Time Studies of Strains at Ferroelectric Domain Walls under an Applied Field

August 17, 2002

Author(s)

Terrence J. Jach, S. Kim, S M. Durbin, J. A. Aust, David S. Bright

We report on an improved method of visualizing domains in congruent ferroelectric crystals such as LiNbO^d3 with Bragg x-ray topography. Using monochromatic synchrotron undulator radiation and a magnifying x-ray camera, we are able to image domains created

Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics

December 1, 2001

Author(s)

Terrence J. Jach, S M. Durbin, A S. Bakulin, David S. Bright, C B. Stagarescu, G Srajer, D. Haskel, J Pedulla

Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of view of

Grazing Incidence X-Ray Photoemission Spectroscopy and the Accuracy of Thickness Measurements of CMOS Gate Dielectrics

August 1, 2001

Author(s)

Terrence J. Jach, E Landree

Grazing incidence x-ray photoelectron spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemical state of ultrathin gate dielectric films. This method utilizes the non-linear dependence of the

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