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Displaying 26 - 50 of 68

NIST Standards for Microanalysis and the Certification Process

December 1, 2002
Author(s)
Ryna B. Marinenko
Procedures for testing research materials for the determination of the extent of within-specimen heterogeneity and between-specimen heterogeneity are described. These procedures, which have been developed and used at NIST in the certification of several

Composition standards for III-V semiconductor epitaxial films

November 11, 2002
Author(s)
Kristine A. Bertness, Lawrence H. Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, Marc L. Salit
A program is underway at NIST to establish standard reference materials (SRMs) for the calibration of instruments used to measure the chemical composition of epitaxially grown III-V semiconductor thin films. These SRMs are designed for the calibration of

Fabrication and Electron Microprobe Characterization of Barium-Strontium-Titanate (BST) Films

February 1, 2001
Author(s)
Ryna B. Marinenko, J T. Armstrong, Debra L. Kaiser, Joseph J. Ritter, Peter K. Schenck, C P. Bouldin, J Blendell, Igor Levin
Barium strontium titanate (BST) thin films of varying composition and thickness (5nm to 400nm) on (100)Si or Pt/(100)Si substrates were measured using an electron microprobe analyzer with wavelength dispersive x-ray spectrometers. Most of the films were

Preparation and Certification of K-411 Glass Microspheres

December 1, 2000
Author(s)
Ryna B. Marinenko, S V. Roberson, J S. Small, Barbara B. Thorne, Douglas H. Blackburn, D Kauffman, Stefan D. Leigh
The production and characterization of NBS K-411 glass microspheres in the 3-40 um range for certification as a NIST Standard Reference Material (SRM) are described. EDS quantitative analysis and heterogeneity evaluations of the microspheres were made with

AlGaAs Composition Measurements from In Situ Optical Reflectance

July 1, 2000
Author(s)
Kristine A. Bertness, J T. Armstrong, Ryna B. Marinenko, Larry Robins, Albert J. Paul, Joseph G. Pellegrino, Paul M. Amirtharaj, Deane Chandler-Horowitz
We measure the composition of AlGaAs layers during epitaxial crystal growth using in situ normal-incidence optical reflectance supported by independent methods of measuring growth rate. The results are compared with conventional ex situ characterization.

Dye Impregnation Method for Revealing Machining Crack Geometry

April 1, 2000
Author(s)
Yasumitsu Matsuo, M. Sando, L K. Ives, Ryna B. Marinenko, George D. Quinn
An observation technique for machining cracks in ceramics has been developed. Palladium (Pd) nitrate water solution was impregnated into a bending specimen using cold isostatic pressing. Following a failure test, crack geometry was determined from a Pd