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Search Publications by: Jabez J McClelland (Fed)

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Displaying 26 - 50 of 249

High-brightness Cs focused ion beam from a cold-atomic-beam ion source

May 2, 2017
Author(s)
Adam V. Steele, Andrew Schwarzkopf, Jabez J. McClelland, Brenton Knuffman
We present measurements of focal spot size and brightness in a focused ion beam system utilizing a laser-cooled atomic beam source of Cs ions. Spot sizes as small as (2.1 ± 0.2) nm (one standard deviation) and brightness values as high as (1.3 ± 0.1) x 107

Communication-Comparison of Nanoscale Focused Ion Beam and Electrochemical Lithiation in beta-Sn Microspheres

December 5, 2016
Author(s)
Saya Takeuchi, William R. McGehee, Jennifer L. Schaefer, Truman M. Wilson, Kevin A. Twedt, Christopher L. Soles, Vladimir P. Oleshko, Eddie H. Chang, Jabez J. McClelland
The development of Li focused ion beams (Li-FIB) enables controlled Li ion insertion into materials with nanoscale resolution. We take the first step toward establishing the relevance of the Li-FIB for studies of ion dynamics in electrochemically active

Giant surface conductivity enhancement in a carbon nanotube composite by ultraviolet light exposure

July 29, 2016
Author(s)
Christian J. Long, Nathan D. Orloff, Kevin A. Twedt, Thomas F. Lam, Luis Fernando Vargas Lara, Minhua Zhao, Bharath NMN Natarajan, Keana C. Scott, Eric Marksz, Tinh Nguyen, Jack F. Douglas, Jabez J. McClelland, Edward J. Garboczi, Jan Obrzut, James A. Liddle
Carbon nanotube composites are lightweight, multifunctional materials with readily adjustable mechanical and electrical properties—relevant to the aerospace, automotive, and sporting goods industries as high-performance building materials. Here, we combine

Cure temperature influences electrical properties via carbon nanotube-rich domain formation

July 27, 2016
Author(s)
Chelsea S. Davis, Nathan D. Orloff, Jeremiah W. Woodcock, Christian J. Long, Kevin A. Twedt, Bharath NMN Natarajan, Jonathan E. Seppala, Jabez J. McClelland, Jan Obrzut, James A. Liddle, Jeffrey W. Gilman
Carbon nanotube (CNT) nanocomposites are enticing materials that enable engineers to tailor structural and electrical properties for applications in the automotive and aerospace industries. CNT mass fraction and the matrix cure temperature are two ways to

Bright focused ion beam sources based on laser-cooled atoms

March 24, 2016
Author(s)
Jabez J. McClelland, Adam V. Steele, Brenton J. Knuffman, Kevin A. Twedt, Andrew D. Schwarzkopf, Truman M. Wilson
Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a

Imaging Nanophotonic Modes of Microresonators using a Focused Ion Beam

January 15, 2016
Author(s)
Kevin A. Twedt, Jie J. Zou, Marcelo I. Davanco, Kartik A. Srinivasan, Jabez J. McClelland, Vladimir A. Aksyuk
Optical microresonators have proven powerful in a wide range of applications, including cavity quantum electrodynamics, biosensing, microfludics, and cavity optomechanics. Their performance depends critically on the exact distribution of optical energy

New Ion Source for High Precision FIB Nanomachining and Circuit Edit

December 31, 2014
Author(s)
Adam V. Steele, Brenton Knuffman, Jabez J. McClelland
We present a review of the Low Temperature Ion Source (LoTIS): its aims, design, performance data collected to date, and focused spot size projections when integrated with a FIB. LoTIS provides a Cs+ beam that has been measured to have high brightness (>

Scanning Ion Microscopy with Low Energy Lithium Ions

July 1, 2014
Author(s)
Kevin A. Twedt, Lei Chen, Jabez J. McClelland
Using an ion source based on photoionization of laser-cooled lithium atoms, we have developed a scanning ion microscope with probe sizes of a few tens of nanometers and beam energies from 500 eV to 5 keV. These beam energies are much lower than the typical

Cold atomic beam ion source for focused ion beam applications

July 23, 2013
Author(s)
Brenton J. Knuffman, Adam V. Steele, Jabez J. McClelland
We report measurements and modeling performed on an ion source based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam (FIB) systems. Our

Nanoscale Focused Ion Beam from Laser-cooled Lithium Atoms

October 26, 2011
Author(s)
Brenton J. Knuffman, Adam V. Steele, Jon Orloff, Jabez J. McClelland
To advance the capabilities of focused ion beam (FIB) technology, we have created a low-energy FIB from photoionized lithium atoms collected in a magneto-optical trap (MOT). This magneto-optical trap ion source relies on both the low temperature of the

Inter-ion Coulomb interactions in a Magneto-Optical Trap Ion Source

May 19, 2011
Author(s)
Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele
We have investigated the role played by inter-ion Coulomb interactions in a magneto-optical trap ion source (MOTIS). Using a Monte Carlo simulation accounting for all pair-wise ion-ion Coulomb interactions in the source, we have calculated the broadening

Electron Vortex Beams with High Quanta of Orbital Angular Momentum

January 14, 2011
Author(s)
Benjamin James McMorran, Amit K. Agrawal, Ian M. Anderson, Andrew A. Herzing, Henri J. Lezec, Jabez J. McClelland, John Unguris
Analogous to vortices in light optical beams, electron optical beams with helical wavefronts carry orbital angular momentum and promise new capabilities for electron microscopy and other applications. We use nanofabricated diffraction holograms in an

A Focused Chromium Ion Beam

October 21, 2010
Author(s)
Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland, Jon Orloff
With the goal of expanding the capabilities of focused ion beam microscopy and milling systems, we have demonstrated nanoscale focusing of chromium ions produced in a magneto-optical trap ion source (MOTIS). Neutral chromium atoms are captured into a