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Search Publications by: Jabez J McClelland (Fed)

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Displaying 26 - 50 of 271

Transport dynamics in a high-brightness magneto-optical-trap Li ion source

September 15, 2020
Author(s)
Jamie Gardner, William R. McGehee, Mark D. Stiles, Jabez J. McClelland
Laser-cooled gases offer an alternative to tip-based methods for generating high brightness ions for focused ion beam applications. These sources produce ions by photoionization of ultracold neutral atoms, where the narrow velocity distribution associated

Streaming Batch Eigenupdates for Hardware Neural Networks

August 6, 2019
Author(s)
Brian D. Hoskins, Matthew W. Daniels, Siyuan Huang, Advait Madhavan, Gina C. Adam, Nikolai B. Zhitenev, Jabez J. McClelland, Mark D. Stiles
Neuromorphic networks based on nanodevices, such as metal oxide memristors, phase change memories, and flash memory cells, have generated considerable interest for their increased energy efficiency and density in comparison to graphics processing units

Engineered Sulfur-MoS2-Graphene Heterostructure Cathodes for Diagnostics of Nanoscale Electrochemical Processes in High Energy Density Li-S Batteries

August 5, 2019
Author(s)
Vladimir P. Oleshko, William R. McGehee, Saya Takeuchi, Siyuan Zhang, Andrei A. Kolmakov, Jabez J. McClelland, Christopher L. Soles
Lithium-sulfur (Li-S) batteries have recently attracted enormous attention because of high theoretical specific energy (2600 Wh kg-1) and high specific capacity (1672 mAhg-1), as well as the low cost, natural abundance, and nontoxicity of elemental sulfur

Direct-write Lithiation of Silicon Using a Focused Ion Beam of Li+

July 8, 2019
Author(s)
William R. McGehee, Evgheni Strelcov, Vladimir P. Oleshko, Christopher L. Soles, Nikolai B. Zhitenev, Jabez J. McClelland
Electrochemical processes that govern the performance of lithium ion batteries involve numerous parallel reactions and interfacial phenomena that complicate the microscopic understanding of these systems. As a new way to study the behavior of ion transport

Spontaneous current constriction in threshold switching devices

April 9, 2019
Author(s)
Jonathan Goodwill, Georg Ramer, Dasheng Li, Brian Hoskins, Georges Pavlidis, Jabez J. McClelland, Andrea Centrone, James A. Bain, Marek Skowronski
Threshold switching devices exhibit extremely non-linear current-voltage characteristics, which are of increasing importance for a number of applications including solid-state memories and neuromorphic circuits. It has been proposed that such non-linear

Characterization of a high-brightness, laser-cooled Li+ ion source

February 20, 2019
Author(s)
Jamie R. Gardner, William R. McGehee, Jabez J. McClelland
Ion sources based on laser cooling have recently provided new pathways to high-resolution microscopy, ion milling, and ion implantation. Here, we present the design and detailed characterization of Li-7 magneto-optical trap ion source (MOTIS) with a peak

Defect Evolution of Ion-Exposed Single-Wall Carbon Nanotubes

January 3, 2019
Author(s)
Jana Kalbacova, Elias J. Garratt, Raul D. Rodriguez, Angela R. Hight Walker, Kevin A. Twedt, Jeffrey Fagan, Teresa I. Madeira, Jabez J. McClelland, Babak Nikoobakht, Dietrich R. Zahn
A systematic evaluation of defects is essential to understand and engineer device properties and applications. Raman spectroscopy is employed for the characterization of carbon nanomaterials in particular to quantitatively evaluate defects from the

Stateful characterization of resistive switching TiO2 with electron beam induced currents

December 7, 2017
Author(s)
Brian D. Hoskins, Gina C. Adam, Evgheni Strelcov, Nikolai B. Zhitenev, Andrei A. Kolmakov, Dmitri B. Strukov, Jabez J. McClelland
Metal oxide resistive switches have become increasingly important as possible artificial synapses in next generation neuromorphic networks. Nevertheless, there is still no codified set of tools for studying fundamental properties of the devices. To this

High-brightness Cs focused ion beam from a cold-atomic-beam ion source

May 2, 2017
Author(s)
Adam V. Steele, Andrew Schwarzkopf, Jabez J. McClelland, Brenton Knuffman
We present measurements of focal spot size and brightness in a focused ion beam system utilizing a laser-cooled atomic beam source of Cs ions. Spot sizes as small as (2.1 ± 0.2) nm (one standard deviation) and brightness values as high as (1.3 ± 0.1) x 107

Communication-Comparison of Nanoscale Focused Ion Beam and Electrochemical Lithiation in beta-Sn Microspheres

December 5, 2016
Author(s)
Saya Takeuchi, William R. McGehee, Jennifer L. Schaefer, Truman M. Wilson, Kevin A. Twedt, Christopher L. Soles, Vladimir P. Oleshko, Eddie H. Chang, Jabez J. McClelland
The development of Li focused ion beams (Li-FIB) enables controlled Li ion insertion into materials with nanoscale resolution. We take the first step toward establishing the relevance of the Li-FIB for studies of ion dynamics in electrochemically active