Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Eric B. Steel (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 25 of 60

Adaptive Peak Fitting for Isotope Analysis via Atom Probe Mass Spectrometry

July 30, 2021
Author(s)
Frederick Meisenkothen, Daniel Samarov, Mark McLean, Irina Kalish, Eric B. Steel
Atom probe tomography (APT) is an emergent characterization technique that has begun to see widespread use within the last 15 years. The technique offers the highest spatial resolution of any mass spectrometry technique for solid-state specimens, as well

Atom Probe Mass Spectrometry of Uranium Isotopic Reference Materials

July 22, 2020
Author(s)
Frederick Meisenkothen, Mark McLean, Irina Kalish, Daniel V. Samarov, Eric B. Steel
Atom probe tomography (APT) has the highest spatial resolution of any mass spectrometry technique, permitting chemically and isotopically resolved images to be recorded at near-atomic length scales. The technique also has a combined ionization efficiency

Exploring the Accuracy of Isotopic Analyses in Atom Probe Mass Spectrometry

May 21, 2020
Author(s)
Frederick Meisenkothen, Daniel V. Samarov, Irina Kalish, Eric B. Steel
Atom probe tomography (APT) can theoretically deliver accurate chemical and isotopic analyses at a high level of sensitivity, precision, and spatial resolution. However, empirical APT data often contain significant biases that lead to erroneous chemical

Analysis of Implanted Silicon Dopant Profiles

September 1, 2013
Author(s)
B. P. Geiser, Eric B. Steel, Karen T. Henry, D. Olson, T.J. Prosa
Atom probe tomography implant dose measurements are reported for National Institute of Standards and Technology Standard Reference Material 2134 (As implant). Efforts were taken to manufacture specimens with limited variation in size and shape to minimize

Chemical Science and Technology Laboratory: Annual Report FY2004

February 9, 2005
Author(s)
W Koch, Eric B. Steel, Ellyn S. Beary
This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and Technology for Fiscal Year 2004. The report includes: a general overview of the laboratory's activities

Chemical Science and Technology Laboratory: Annual Report FY2003

February 1, 2004
Author(s)
W Koch, Eric B. Steel, Ellyn S. Beary
This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and Technology for Fiscal Year 2003. The report includes: a general overview of the laboratory's activities

Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis

September 1, 2003
Author(s)
Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B. Steel, F A. Stevie
Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the