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Search Publications by: Mark D. Vaudin (Assoc)

Displaying 176 - 184 of 184

Measuring Bimodal Crystallographic Texture in Ferroelectric PZT Thin Films

February 1, 2000

Author(s)

Mark D. Vaudin, G R. Fox

A powder x-ray diffraction method has been developed to measure the volume fraction of (111), (100), and randomly oriented PZT in 200 nm thick films used for FRAM applications. The integrated and peak intensities of 100, 110, 200 and 222 Bragg peaks from

Determination of Texture From Individual Grain Orientation Measurements

November 17, 1999

Author(s)

J Blendell, Mark D. Vaudin, Lin-Sien H. Lum

We present a technique for determining the texture of a polycrystalline material based on the measurement of the orientation of a number of individual grains. We assume that the sample has fiber texture and that the texture can be characterized by a

Accurate Texture Measurements on Thin Films Using a Powder X-Ray Diffractometer

June 1, 1999

Author(s)

Mark D. Vaudin

A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed for measuring crystalline texture. A θ - 2θscan of a Bragg peak from the textured planes is collected and also a θ scan, or rocking curve, using the same

Effect of Electrode Layer on the Polydomain Structure of Epitaxial PbZr 0.2 Ti 0.8 O 3 Thin Films

March 15, 1999

Author(s)

S P. Alpay, V Nagarajan, Leonid A. Bendersky, Mark D. Vaudin, S Aggarwal, R Ramesh, Alexander L. Roytburd

PbZr 0.2Ti 0.8O 3(PZT) thin films with and without La 0.5Sr 0.5CoO 3(LSCO) electrodes were grown epitaxially on (001) SrTiO 3 (STO) at 650 C by pulsed laser deposition. The domain structure of the 400 nm thick PZT films with different electrode layer

Effect of Film Composition on the Orientation of (Ba,Sr)TiO 3 Grains in (Ba,Sr) y TiO 2+y Thin Films

January 12, 1999

Author(s)

Debra L. Kaiser, Mark D. Vaudin, L D. Rotter, John E. Bonevich, J T. Armstrong

(Ba,Sr) yTiO 2+y thin films with 0.34 {1-xSr xTiO 3 (x {aproximately equal to} 0.06) and an amorphous phase. The orientation of the tetragonal Ba 1-xSr xTiO 3 grains (pure a axis, pure c axis, or a mix of the two) was found to be strongly dependent upon