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Search Publications by: Theodore V. Vorburger (Assoc)

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Displaying 26 - 50 of 417

User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition

February 15, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, Michael Gaitan, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property

Topography Measurements and Performance Comparisons between NIST SRM 2460 Standard Bullet Masters and BKA Bullet Replicas

July 31, 2012
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert M. Thompson, Susan M. Ballou, Xiaoyu Alan Zheng, Thomas Brian Renegar, Richard M. Silver
Two Standard Reference Material (SRM) 2460 Bullets produced by the National Institute of Standards and Technology (NIST) were used as masters for the fabrication of replica bullets at the Bundeskriminalamt (BKA). The surface topography of the SRM masters

On CD-AFM bias related to probe bending

April 9, 2012
Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported on

Development of Ballistics Identification - From Image Comparison to Topography Measurement in Surface Metrology-

March 22, 2012
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert M. Thompson, Thomas Brian Renegar, Xiaoyu Alan Zheng, James H. Yen, Richard M. Silver, Wei Chu
Fired bullets and ejected cartridge cases have unique ballistics signatures left by the firearm. By analyzing the ballistics signatures, forensic examiners can trace these bullets and cartridge cases to the firearm used in a crime scene. Current automated

Stylus Tip-Size Effect on the Calibration of Periodic Roughness Specimens with Rectangular Profiles

March 21, 2012
Author(s)
Thomas B. Renegar, Johannes A. Soons, Balasubramanian Muralikrishnan, John S. Villarrubia, Xiaoyu A. Zheng, Theodore V. Vorburger, Jun-Feng Song
Stylus instruments are widely used for surface characterization. It is well known that the size and shape of the stylus tip affects the measured surface geometry and parameters. In most cases, increasing the tip size decreases the measured Ra value because

The National Ballistics Imaging Comparison (NBIC) Project

March 10, 2012
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Susan M. Ballou, Robert M. Thompson, James H. Yen, Thomas Brian Renegar, Xiaoyu Alan Zheng, Richard M. Silver, Martin Ols
In response to the guidelines issued by the ASCLD/LAB-International (American Society of Crime Laboratory Directors/Laboratory Accreditation Board) to establish traceability and quality assurance in U.S. crime laboratories, a NIST/ATF joint project

An Iterative Algorithm for Calculating Stylus Radius Unambiguously

September 24, 2011
Author(s)
Theodore V. Vorburger, Xiaoyu A. Zheng, Thomas B. Renegar, Jun-Feng Song, Li Ma
The stylus radius is an important specification for stylus instruments and is commonly provided by instrument manufacturers. However, it is difficult to measure the stylus radius unambiguously. Accurate profiles of the stylus tip may be obtained by

User's Guide for SRM 2494 and 2495: The MEMS 5-in-1, 2011 Edition

September 6, 2011
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a standard reference device sold as a NIST Standard Reference Material (SRM) that contains MEMS test structures on a test chip. The two SRM chips (2494 and 2495) provide for both dimensional and material

Light Scattering Methods

April 9, 2011
Author(s)
Theodore V. Vorburger, Richard M. Silver, Rainer Brodmann, Boris Brodmann, Jorg Seewig
Light scattering belongs to a class of techniques known as area-integrating methods for measuring surface texture. Rather than being based on coordinate measurement, these methods probe an area of the surface altogether and yield parameters that are

Nano- and Atom-scale Length Metrology

October 1, 2010
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Richard A. Allen, Michael W. Cresswell, Vincent A. Hackley
Measurements of length at the nano-scale have increasing importance in manufacturing, especially in the electronics and biomedical industries. The properties of linewidth and step height are critical to the function and specification of semiconductor

Striation Density for Predicting the Identifiability of Fired Bullets

September 1, 2010
Author(s)
Wei Chu, Jun-Feng Song, Theodore V. Vorburger, Susan M. Ballou
Without a selection procedure to exclude the bullets having insufficient individualized ballistics signature, automated ballistics identification systems will correlate an evidence bullet with all reference bullets stored in the database. Correlations that