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Search Publications by: Marlon L. Walker (Fed)

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Displaying 26 - 28 of 28

Cluster Primary Ion Beam Secondary Ion Mass Spectrometry for Semiconductor Characterization

January 1, 2001
Author(s)
John G. Gillen, S V. Roberson, Albert J. Fahey, Marlon L. Walker, J Bennett, R Lareau
We are evaluating the use of polyatomic and cluster primary ion beams for characterization of semiconductor materials by secondary ion mass spectrometry using both magnetic sector and time-of-flight SIMS instruments. Primary ion beams of SF 5+, C 8- and

The Effect of an Oxidized Gold Substrate on Alkanethiol Self-Assembly

June 1, 2000
Author(s)
John T. Woodward IV, Marlon L. Walker, Curtis W. Meuse, David J. Vanderah, G Poirier, Anne L. Plant
UV cleaned gold substrates incubated in solutions of alkanethiol show islands on the monolayer surface when imaged with non-contact atomic force microscopy (AFM). The height of the islands above the monolayer is approximately twice the height of the