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Search Publications by: Evan K. Wallace (Fed)

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Displaying 1 - 25 of 63

Enabling Traceability in Agri-Food Supply Chains Using an Ontological Approach

March 25, 2022
Author(s)
Farhad Ameri, Evan K. Wallace, Reid Yoder, Frank H. Riddick
Traceability of food products to their sources is critical for quick responses to food emergencies. US law now requires stakeholders in the agri-food supply chain to support traceability by tracking food materials they acquire and sell. However, having the

Towards a Reference Ontology for Supply Chain Management

February 9, 2021
Author(s)
Evan K. Wallace
This paper summarizes the results from recent activities of the IOF Supply Chain Working Group (SC WG). The objectives of the IOF SC WG are to identify requirements, notions and terms from the supply chain domain, develop a domain-specific reference

ENABLING TRACEABILITY IN AGRI-FOOD SUPPLY CHAINS USING AN ONTOLOGICAL APPROACH

November 3, 2020
Author(s)
Evan K. Wallace, Farhad Ameri, Reid Yoder
Traceability of food products to their sources is critical for quick responses to a food emergency. US law now requires stakeholders in the agri-food supply chain to support traceabil-ity by tracking food materials they acquire and sell. However, having

Implementing Grain Traceability Standards: CART and Simulation

February 18, 2020
Author(s)
Frank H. Riddick, Evan K. Wallace, Scott Nieman, Joe Tevis, R. A. Ferreyra
To ensure food safety, food manufacturers need the ability to quickly identify and trace food products to all equipment and processes throughout the entire associated food supply, production, and transportation network. Government and industry have

2018 NIST/OAGi Workshop: Enabling Composable Service-Oriented Manufacturing Systems

April 22, 2019
Author(s)
Nenad Ivezic, Boonserm Kulvatunyou, Michael P. Brundage, Yan Lu, Evan K. Wallace, Albert W. Jones
This report summarizes the results from the 2018 NIST/OAGi Workshop: Enabling Composable Service-Oriented Manufacturing Systems, which was held at the National Institute of Standards and Technology campus in Gaithersburg, MD, on April 23-24, 2018. This was

The Industrial Ontologies Foundry Proof-of-Concept Project

August 26, 2018
Author(s)
Boonserm Kulvatunyou, Evan K. Wallace, Dimitris Kiritsis, Barry Smith, Chris Will
The current industrial revolution is said to be driven by the digitization of manu-facturing that exploits connected information across all aspects of manufacturing. Standards have been recognized as an important enabler. Ontology is the next generation

Reference Architecture for Smart Manufacturing Part 1: Functional Models

September 29, 2016
Author(s)
Edward J. Barkmeyer Jr., Evan K. Wallace
This document is a part of the definition of a reference architecture for the integration of manufacturing software applications in the areas of fabrication and assembly of discrete electro- mechanical parts. This document captures, at a high level of

Mitigating Ingredient Variability Risks with Smart Manufacturing

February 18, 2016
Author(s)
Frank H. Riddick, Evan K. Wallace, Jim Davis
Managing the design of products and the efficient execution of the manufacturing processes needed to produce them is an endeavor fraught with all manner of risks for manufacturing enterprises large and small. In certain industries, such as the food

Toward Manufacturing System Composability Analysis: A Use Case Scenario

September 20, 2014
Author(s)
Boonserm Kulvatunyou, Evan K. Wallace, Nenad Ivezic, Yunsu Lee
One of the characteristics of a smart manufacturing system is the ability to quickly adapt to new and changing requirements. This implies that software and hardware components of the manufacturing system need to be easily composed and recomposed. In

NIST Workshop on Ontology Evaluation (NISTIR 7774)

April 1, 2011
Author(s)
Ram D. Sriram, Conrad E. Bock, Fabian M. Neuhaus, Evan K. Wallace, Mary C. Brady, Mark Musen, Joanne Luciano
The National Institute for Standards and Technology sponsored a workshop in October, 2007, on the subject of ontology evaluation. An international group of invited experts met for two days to discuss problems in measuring ontology quality. The workshop