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Search Publications by: Bryan C. Waltrip (Fed)

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Displaying 26 - 50 of 56

Comparison of High Frequency AC-DC Voltage Transfer Standards at NRC, VSL, PTB, and NIST

May 1, 2000
Author(s)
Piotr S. Filipski, C. J. van Mullem, D. Janik, M. Klonz, Joseph R. Kinard Jr., Thomas E. Lipe Jr., Bryan C. Waltrip
The paper summarizes results of two international comparisons relating TVC RF voltage transfer standards of the National Research Council of Canada (NRC) to the standards of three National Metrology Institutes (NMIs): NMi Van Swinden Laboratorium (VSL)

Improved Time-Base for Waveform Parameter Estimation

May 1, 2000
Author(s)
Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken
An improved gated-oscillator time-base and associated auto-calibration algorithm for use in a high-accuracy sampling waveform acquistion system are described. The time-base architecture consists of a stable 100 MHz gated-oscillator, 24-bit counter chain

Nonrandom Quantization Errors in Timebases

May 1, 2000
Author(s)
Gerard N. Stenbakken, D. Liu, J. A. Starzyk, Bryan C. Waltrip
Timebase distortion causes nonlinear distortion of waveforms measured by sampling instruments. When such instruments are used to measure the rms amplitude of the sampled waveforms, such distortions result in errors in the measured rms values. This paper

The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic

April 1, 2000
Author(s)
S. Avramov, Andrew D. Koffman, Nile M. Oldham, Bryan C. Waltrip
A joint effort between the U.S. Naval Academy and the National Institute of Standard and Technology (NIST) resulted in the development of a method to characterize the capacitance and dissipation factor of a set of commercial standard four terminal-pair

Conference Report on the Workshop on Electronic Commerce of Component Information

May 30, 1999
Author(s)
James A. St Pierre, Curtis H. Parks, Bryan C. Waltrip
This report provides an overview of a recent workshop held at NIST in Gaithersburg, July 15-17th on Electronic Commerce of Component Information. The report summarizes the discussions following the workshop's panel sessions and the plans for follow-on work

A System to Measure Current Transducer Performance

July 1, 1998
Author(s)
Bryan C. Waltrip, Thomas L. Nelson
A special purpose ac current transducer measurement system capable of intercomparing transducers with ac output voltage ratios from 1:1 to 50:1 has been developed to extend the range and accuracy of current transformer, current shunt, and mutual inductor

Capacitance and Dissipation Factor Measurements from 1 kHz to 10 MHz

July 1, 1998
Author(s)
Andrew D. Koffman, Bryan C. Waltrip, Nile M. Oldham, S. Avramov
A measurement technique developed by K. Yokoi et al. At Hewlett-Packard Japan, Ltd. Has been duplicated and evaluated at NIST to characterize four-terminal pair capacitors. The technique is based on an accurate three-terminal measurement made at 1 kHz