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Search Publications by: Thomas A. Germer (Fed)

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Displaying 101 - 125 of 191

Polarized Light Diffusely Scattered Under Smooth and Rough Interfaces

December 1, 2003
Author(s)
Thomas A. Germer
We develop models for light scattering appropriate for glossy and matte paints. Volume scattering is treated in the single scattering regime and the diffusive scattering regime. In the single scattering regime, scattering is treated in the Rayleigh-Gans

Characterizing Surface Roughness of Thin Films by Polarized Light Scattering

November 1, 2003
Author(s)
Thomas A. Germer, Michael J. Fasolka
The polarization of light scattered by the surface of a material contains information that can be used to identify the sources of that scatter. In this paper, first order vector perturbation theory for light scattering from interfacial roughness of a

Scattering by Slightly Non-Spherical Particles on Surfaces

October 6, 2003
Author(s)
Thomas A. Germer
We investigate the shape dependence of the scattering by dielectric and metallic particles on surfaces by considering particles whose free-space scattering properties are nearly identical. The scattering by metallic particles is fund to be strongly

Cosolvent-assisted Spray Pyrolysis for the Generation of Metal Particles

July 1, 2003
Author(s)
Valeri I. Babushok, S H. Ehrman, Thomas Germer, Jae H. Kim, George W. Mulholland
A co-solvent assisted spray pyrolysis process was developed for the formation of pure metal particles from metal salt precursors without the direct addition of hydrogen or other reducing gas. Generation of pure copper and nickelparticles from aqueous

SCATMECH: Polarized Light Scattering C++Class Library (Version 4.00)

June 1, 2003
Author(s)
Thomas A. Germer
A C++ object class library has been developed to distribute bidirectional reflectance distribution function (BRDF) models for light scattering from surfaces. Emphasis has been given to those models which are physically-based and which predict the

Measurement of the 100 nm NIST SRM 1963 by Laser Surface Light Scattering

November 1, 2002
Author(s)
Thomas A. Germer, George W. Mulholland, Jae Hyun Kim, S H. Ehrman
Accurate sizing of particles deposited on surfaces is important for the semiconductor, optical, and data storage industries. The recent availability of accurate light scattering models for non-ideal conditions enables the determination of particle size

Measurement of Lithographic Overlay by Light-Scattering Ellipsometry

September 1, 2002
Author(s)
Thomas A. Germer
We demonstrate a measurement of lithographic overlay using light scattering ellipsometry. In the limit of small amplitude surfactopography, the polarization of light scattered by the two interfaces of a dielectric film can be decomposed into the roughness

Polarized Light Scattering by Dielectric and Metallic Spheres on Silicon Wafers

September 1, 2002
Author(s)
Jae H. Kim, S H. Ehrman, George W. Mulholland, Thomas Germer
The Polarization and intensity of light scattered by monodisperse polystyrene latex and copper spheres, with diameters ranging from 92 to 218 nm, deposited on silicon substrates were measured with 442-, 532-, and 633-nm light. The results are compared with

Light Scattering by Slightly Nonspherical Particles on Surfaces

July 1, 2002
Author(s)
Thomas A. Germer
We investigate the shape dependence of the scattering by dielectric and metallic particles on surfaces by considering particles whose free-space scattering properties are nearly identical. The scattering by metallic particles is very strongly dependent

Size-Monodisperse Metal Nanoparticles Via Hydrogen-Free Spray Pyrolysis

April 3, 2002
Author(s)
Jung Hyeun Kim, Thomas A. Germer, George Mulholland, S H. Ehrman
Pure copper nanoparticles were produced using a co-solvent approach avoiding use of hydrogen or other reducing gas. Compared with the particles formed without the co-solvent, the addition of alcohol has a significant effect in preventing oxidation, which

Colorimetric Characterization of Pearlescent Coatings

January 1, 2002
Author(s)
Maria E. Nadal, Thomas A. Germer
This paper descirbes recent developments at the National Institution of Standards and Technology in the colorimetric characterization of pearlescent coatings. The goal of this research is to develop standard measurement protocols for the accurate color