Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Yoshi Ohno (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 251 - 275 of 391

Photometry: Sensing Light Color

September 1, 2001
Author(s)
Yoshihiro Ohno, Steven W. Brown
This article first addresses the need and importance of photometry and colorimetry for many products in our daily life- light bulbs in homes and offices; TV sets, computer monitors, headlights of cars, traffic lights, etc. Then the concepts of photometry

The Art and Science of Lamp Photometry

August 1, 2001
Author(s)
R S. Bergman, Yoshi Ohno
This paper first overviews photometric quantities of lamps - luminous flux, luminous intensity, illuminance, and luminance - and general techniques for measurement of these quantities to characterize lamps. The total luminous flux of lamps (in lumens) is

Total Luminous Flux Calibrations of LEDs at NIST

August 1, 2001
Author(s)
Carl C. Miller, Yoshihiro Ohno
The total luminous flux (lumen) is one of the most important characteristics of Light Emitting Diodes (LEDs), and is commonly measured using integrating sphere photometers. Large variations of measurement results are reported among different manufacturers

Luminous Intensity Calibrations and Colorimetry of LEDs at NIST

July 1, 2001
Author(s)
Carl C. Miller, Yoshihiro Ohno
Light Emitting Diodes (LEDs) are unique light sources differing greatly from traditional lamps in terms of physical size, flux level, spectrum and spatial distribution. The transfer of photometric scales from luminous intensity standard lamps to LEDs is

NIST Colorimetric Calibration Facility for Displays - Part 2

June 1, 2001
Author(s)
F Manoocheri, Steven W. Brown, Yoshi Ohno
velopment of a calibration facility for spectroradiometric, colorimetric, and goniometric measurements of displays, display colorimeters, and spectroradiometers has been completed at the National Institute of Standards and Technology (NIST). An overview of

Luminous Flux Calibrations of LEDs at NIST

May 1, 2001
Author(s)
Carl C. Miller, Yoshihiro Ohno
The total luminous flux (lumen) is one of the most important characteristics of Light Emitting Diodes (LEDs), and is commonly measured using integrating sphere photometers. Large variations of measurement results are reported among different manufacturers

Spectroradiometer Characterization for Colorimetry of LEDs

May 1, 2001
Author(s)
Yoshihiro Ohno, B Kranicz
The uncertainties in color measurements of LEDs by spectroradiometers can be much larger than those for traditional broadband sources due to the quasi-monochromatic nature of LED spectra. In this paper, the uncertainties in chromaticity of LEDS due to

A Numerical Method for Color Uncertainty

January 1, 2001
Author(s)
Yoshihiro Ohno
A method for calculating uncertainties of color quantities has been developed using a numerical approach based on the ISO Guide to the Expression of Uncertainty in Measurement. The uncertainties of any color quantities such as chromaticity coordinates