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Search Publications by: Yoshi Ohno (Assoc)

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Displaying 126 - 150 of 391

Optical Metrology for LEDs and Solid State Lighting

February 9, 2006
Author(s)
Yoshi Ohno
The performance of Light Emitting Diodes (LEDs), including efficiency, flux level, lifetime, and the variation of color, is advancing at a remarkable pace. LEDs are increasingly used for many applications including automotive, aviation, display

Development of a Color Quality Scale

February 8, 2006
Author(s)
Wendy L. Davis, Yoshihiro Ohno
A new metric for evaluating the color quality of light sources is being developed at NIST, in close contact with the lighting industry and the CIE. The current CIE Color Rendering Index (CRI) is outdated and has several known deficiencies. The CRI only

Calibration and Characterization of UV Sensors for Water Disinfection

January 2, 2006
Author(s)
Thomas C. Larason, Yoshihiro Ohno
Ultraviolet radiation (UV) effectively inactivates common pathogens found in ground and surface waters such as Cryptosporidium, Giardia, and most bacterial pathogens (e. g., E. coli). Water treatment facilities recently started using ultraviolet radiation

Correction of Stray Light in Spectrographs: Implications for Remote Sensing

August 22, 2005
Author(s)
Yuqin Zong, Steven W. Brown, Bettye C. Johnson, Keith R. Lykke, Yoshihiro Ohno
Spectrographs are used in a variety of applications in the field of remote sensing for radiometric measurements due to the benefits of measurement speed, sensitivity, and portability. However, spectrographs are single grating instruments that are

Spectral Matching With an LED-Based Spectrally Tunable Light Source

August 4, 2005
Author(s)
Irena Fryc, Steven W. Brown, Yoshihiro Ohno
A spectrally tunable light source using a large number of LEDs and an integrating sphere has been designed and constructed at the National Institute of Standards and Technology (NIST). The source is designed to have a capability of producing any visible