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Search Publications by: Yoshi Ohno (Assoc)

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Displaying 201 - 225 of 391

Development and Application Issues of a Spectrally Tunable LED Source

June 8, 2004
Author(s)
George P. Eppeldauer, Steven W. Brown, G Dezsi, Irena Fryc, Yoshihiro Ohno
A spectrally tunable solid state source based on Light Emitting Diodes (LEDs) is being developed at the National Institute of Standards and Technology (NIST). The tunable source will emulate the spectral distributions of various light sources and can be

NIST Display Colorimeter Calibration Facility

August 1, 2003
Author(s)
Steven W. Brown, Yoshihiro Ohno
A facility has been developed at the National Institute of Standards and Technology (NIST) to provide calibration services for color-measuring instruments to address the need for improving and certifying the measurement uncertainties of this type of

Physical Measurement of Flashing Lights - Now and Then

July 1, 2003
Author(s)
Yoshihiro Ohno
This paper begins with a historical review of flashing lights and physical measurement of flashing lights since the time the Blondel-Rey equation was developed. Then the recent work on the physical measurement standards for flashing lights, developed in

Detector-Based Sphere Photometry for Industry

June 2, 2003
Author(s)
Yoshihiro Ohno, R S. Bergman
The Absolute Integrating Sphere Method is now used at NIST for the detector-based calibration of total luminous flux of lamps, as well as for the realization of the lumen. This method has many benefits for high-accuracy applications, allowing for