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Search Publications by: Eric S. Stanfield (Fed)

Displaying 26 - 31 of 31

New Capabilities At NIST In Dimensional Metrology

January 1, 2005

Author(s)

Theodore D. Doiron, Eric S. Stanfield, Bryon S. Faust, John R. Stoup, Mary Abbott

A number of new or revised services in dimensional metrology are presented. Included are: a lower cost, high accuracy calibration for sphere diameter; reduced uncertainty in roundness calibration; a new instrument for measurement of the thermal expansion

Deformation of Gauge Blocks

January 1, 2002

Author(s)

Theodore D. Doiron, Eric S. Stanfield, Dennis S. Everett

When a force is exerted on any material, the material deforms. Most of the time the effect is small and is neglected. In the measurement of gauge blocks, where the uncertainty goal is stated in nanometers, the deformation is a very large effect, and can be

Case Against Optical Gauge Block Metrology

September 1, 1998

Author(s)

Theodore D. Doiron, Dennis S. Everett, Bryon S. Faust, Eric S. Stanfield, John R. Stoup

The current definition of length of a gage block is a very clever attempt to evade the systematic errors associated with the wringing layer thickness and optical phase corrections. In practice, there are very large systematic operator and surface effects