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Search Publications by: Neil M. Zimmerman (Assoc)

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Displaying 1 - 25 of 161

DC to GHz measurements of a near-ideal 2D material: P+ monolayers

March 8, 2024
Author(s)
Neil M. Zimmerman, Antonio Levy, Pradeep Namboodiri, Joshua M. Pomeroy, Xiqiao Wang, Joseph Fox, Richard M. Silver
P+ monolayers in Si are of great scientific and technological interest, both intrinsically as a material in the "ideal vacuum" of crystalline Si, and because they are showing great promise as qubits of electron and nuclear spin. The GHz complex

National Institute of Standards and Technology Environmental Scan 2020

February 9, 2021
Author(s)
Heather Evans, Kristen K. Greene, William M. Healy, Elizabeth Hoffman, Kate Rimmer, Anna V. Sberegaeva, Neil M. Zimmerman
The 2020 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the fulfillment of its mission in coming years. The analyses were conducted through four separate lenses

Reduction of charge offset drift using plasma oxidized aluminum in SETs

October 26, 2020
Author(s)
Yanxue Hong, Ryan Stein, Michael Stewart, Neil M. Zimmerman, Joshua M. Pomeroy
Aluminum oxide (AlOx)-based single-electron transistors (SETs) fabricated in ultra-high vacuum (UHV) chambers using in situ plasma oxidation show excellent stabilities over more than a week, enabling applications as tunnel barriers, capacitor dielectrics

The Next Generation of Current Measurement for Ionization Chambers

September 1, 2020
Author(s)
Ryan P. Fitzgerald, Denis E. Bergeron, Dean G. Jarrett, Neil M. Zimmerman, Carine Michotte, Hansjoerg Scherer, Stephen Giblin, Steven Judge
Re-entrant ionization chambers (ICs) are essential to radionuclide metrology and nuclear medicine for maintaining standards and measuring half-lives. Metrology-quality systems must be precise and stable to 0.1% over many years, and linear from 10^(-14) A

Ohms Law Low-current Calibration System for Ionization Chambers

August 24, 2020
Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor in series with a stable voltage source to generate calibration currents from 1 pA to 20 nA

Long-term drift of Si-MOS quantum dots with intentional donor implants

May 21, 2019
Author(s)
m rudolph, B Sarabi, Roy E. Murray, M Carroll, Neil M. Zimmerman
Charge noise can be detrimental to the operation of quantum dot (QD) based semiconductor qubits. We study the low-frequency charge noise by charge o set drift measurements for Si-MOS devices with intentionally implanted donors near the QDs. We show that

Machine Learning techniques for state recognition and auto-tuning in quantum dots

January 20, 2019
Author(s)
Sandesh Kalantre, Justyna Zwolak, Stephen Ragole, Xingyao Wu, Neil M. Zimmerman, Michael Stewart, Jacob Taylor
Recent progress in building large-scale quantum devices for exploring quantum computing and simulation paradigms has relied upon effective tools for achieving and maintaining good experimental parameters, i.e. tuning up devices. In many cases, including in

Spin decoherence in a two-qubit CPHASE gate: the critical role of tunneling noise

November 27, 2018
Author(s)
Peihao Huang, Neil M. Zimmerman, Garnett W. Bryant
The rapid progress in the manipulation and detection of semiconductor spin qubits enables the experimental demonstration of a high fidelity two-qubit logic gate, which is necessary for universal quantum computing. Here, we study the decoherence of two