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Search Publications by: Zachary H. Levine (Fed)

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Displaying 101 - 125 of 150

Excitonic Effects on Optical Second-Harmonic Polarizabilities of Semiconductors

January 1, 2002
Author(s)
E K. Chang, Zachary H. Levine, Eric L. Shirley
We present an ab initio many-body formalism for computing the frequency-dependent second-harmonic polarizability of semiconductor materials that includes both local-field and excitonic effects. We calculate the second-harmonic polarizability for AIP, AIAs

Mass Absorption Coefficient of Tungsten, 1606-2100 eV

January 1, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
The transmission of soft x-rays with photon energies from 1606 eV to 2106 eV was measured for tungsten using thin film samples and a synchrotron source. This region includes the M IV and M V edges. The two tungsten films had thicknesses of 107.7 10 nm and

Hidden in Plain Sight: Calcium Fluoride's Intrinsic Birefringence

December 1, 2001
Author(s)
John H. Burnett, Zachary H. Levine, Eric L. Shirley
We discuss the phenomena of intrinsic birefringence in cubic crystals that we first characterized experimentally and theoretically in ultraviolet optical materials. We analyze the wavelength dependence, the angular dependence, and symmetry of the effect

Intrinsic Birefringence in Calcium Fluoride and Barium Floride

December 1, 2001
Author(s)
John H. Burnett, Zachary H. Levine, Eric L. Shirley
We have measured an intrinsic birefringence in calcium fluoride in the ultraviolet for wavelengths from 365 nm down to 156 nm, and compared these results with theory and calculations. The measured effect is largest for propagation in the [110] direction

X-Ray Tomography of Integrated Circuit Interconnects: Past and Future

November 1, 2001
Author(s)
Zachary H. Levine
An Al-W-silica integrated circuit interconnect sample was thinned to several micro υ and scanned across a 200 nm focal spot of a Fresnel zone plate operating at photon energy of 1573 eV. The experiment was performed on beamline 2-ID-B of the Advanced

Tomography of Integrated Circuit Interconnects

October 1, 2001
Author(s)
Zachary H. Levine, A R. Kalukin, M Kuhn, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Uwe Arp, Thomas B. Lucatorto, Bruce D. Ravel, Charles S. Tarrio
00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigration

Accurate Pattern Registration for Integrated Circuit Tomography

July 1, 2001
Author(s)
Zachary H. Levine, S Grantham, S Neogi, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Thomas B. Lucatorto
As part of an effort to develop high resolution microtomography for engineered structures, a two-level copper integrated circuit interconnect was imaged using 1.83 keV x-rays at 14 angles employing a full-field Fresnel zone plate microscope. A major