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Search Publications by: Igor Levin (Fed)

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Displaying 226 - 250 of 264

Crystal Chemistry and Phase Equilibria of Selected SrO- R 2 O 3 -CuO x and Related Systems, R=Lanthanides and Yttrium

December 1, 2001
Author(s)
Winnie K. Wong-Ng, Qingzhen Huang, Igor Levin, James A. Kaduk, J Dillingham, T J. Haugan, J Suh, Lawrence P. Cook
This paper investigates and reviews the trend of phase formation and crystal chemistry of selected series of compounds in SrO- R 2O 3-CuO x and related systems. Including in this discussion are (Ba,Sr) 2RCu 3O 6+x, where M = selected representative and

Phase Equilibria of the SrO-Yb 2 O 3 -CuO x System in Air

September 1, 2001
Author(s)
J Dillingham, Winnie Wong-Ng, Igor Levin
The phase diagram of the SrO-Yb 2O 3-CuO x system was investigated in air. The solid solution (Sr 14-xYb x)Cu 24O z (O 13Yb)Cu 24O z indicated that this phase is incommensurate, with the modulation wave vector q=(1/2-z)c*, znearly equal to}0.066. The Sr

Ca 4 Nb 2 0 9 -CaTi0 3 : Phase Equilibria and Microstructures

August 1, 2001
Author(s)
Leonid A. Bendersky, Igor Levin, Robert S. Roth, Alexander J. Shapiro
Ca 4TiO 3-Ca 4Nb 2O 9 is a quasi-binary section, and all the phases participating in equilibrium are solid solutions of the binary end-members. The phases are perovskite-based ABO3-type, with a common stoichiometry Ca[Ca (1-x)/(3-2x)Nb (2-2x)/ (3-2x)Ti x/

In Situ Raman Spectroscopic Investigation of Chromium Surfaces Under Hydrothermal Conditions

August 1, 2001
Author(s)
James E. Maslar, Wilbur S. Hurst, Walter J. Bowers Jr., Jay H. Hendricks, M I. Aquino, Igor Levin
Three chromium coupons were exposed to air-saturated water at pressures of ca. 25 MPa and temperatures up to 545 C in an optically accessible flow cell. In situ Raman spectra were collected at different temperatures as the coupons were heated and then

Challenges of High-[kappa] Gate Dielectrics for Future MOS Devices

May 13, 2001
Author(s)
John S. Suehle, Eric M. Vogel, Monica D. Edelstein, Curt A. Richter, Nhan Van Nguyen, Igor Levin, Debra Kaiser, Hanchang F. Wu, J B. Bernstein
As the feature sizes of complementary metal-oxide-semiconductor (CMOS) devices are scaled downward, the gate dielectric thickness must also decrease to maintain a value of capacitance to reduce short-channel effects and to keep device drive current at an

The Raman Spectra of Cr 3 O 8 and Cr 2 O 5

March 1, 2001
Author(s)
James E. Maslar, Wilbur S. Hurst, Terrell A. Vanderah, Igor Levin
The Raman spectra of polycrystalline Cr 3O 8 and Cr 2O 5 powders were measured. The powders were prepared by thermal decomposition of CrO 3 under flowing oxygen. Their composition was verified with x-ray diffraction. Raman spectra were excited with both

Fabrication and Electron Microprobe Characterization of Barium-Strontium-Titanate (BST) Films

February 1, 2001
Author(s)
Ryna B. Marinenko, J T. Armstrong, Debra L. Kaiser, Joseph J. Ritter, Peter K. Schenck, C P. Bouldin, J Blendell, Igor Levin
Barium strontium titanate (BST) thin films of varying composition and thickness (5nm to 400nm) on (100)Si or Pt/(100)Si substrates were measured using an electron microprobe analyzer with wavelength dispersive x-ray spectrometers. Most of the films were

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001
Author(s)
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.