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Search Publications by: Jon R. Pratt (Fed)

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Displaying 126 - 150 of 230

Spring constant calibration of AFM cantilevers with a piezosensor transfer standard

September 24, 2007
Author(s)
Eric Langlois, Gordon A. Shaw, John A. Kramar, Jon R. Pratt, Donna C. Hurley
We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and accompanying electronics. The piezosensor was calibrated before use

Direct Electrostatic Calibration of Hybrid Sensors for Small Force Measurement

June 4, 2007
Author(s)
Koo-Hyun Chung, Gordon A. Shaw, Jon R. Pratt
The measurement of forces from piconewtons to millinewtons is an area of interest from both an applied and pure research standpoint, however creating a link between small forces and the International System of Units (SI) has been difficult. In this work, a

Traceable Micro-Force Sensor for Instrumented Indentation Calibration

April 10, 2007
Author(s)
Douglas T. Smith, Gordon A. Shaw, R M. Seugling, D Xiang, Jon R. Pratt
Instrumented indentation testing (IIT), commonly referred to as nanoindentation when small forces are used, is a popular technique for determining the mechanical properties of small volumes of material. Sample preparation is relatively easy, usually

A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration

April 8, 2007
Author(s)
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Douglas T. Smith, John M. Moreland
We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sensor is

Traceable Micro-Force Calibration for Instrumented Indentation Testing

February 13, 2007
Author(s)
Douglas T. Smith, Gordon A. Shaw, Richard Seugling, Jon R. Pratt, Dan Xiang
We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system consists

Prototype Cantilevers for SI Traceable NanoNewton Force Calibration

September 20, 2006
Author(s)
Richard S. Gates, Jon R. Pratt
A series of extremely uniform prototype reference cantilevers has been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of

Prototype Cantilevers for SI-Traceable NanoNewton Force Calibration

September 20, 2006
Author(s)
Richard S. Gates, Jon R. Pratt
A series of extremely uniform prototype reference cantilevers have been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of

New reference standards and artifacts for nanoscale physical property characterization

July 1, 2006
Author(s)
Jon R. Pratt, John A. Kramar, Gordon Shaw, Richard Gates, Paul Rice, John M. Moreland
This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications

Force Calibration Via Electrostatics

January 1, 2006
Author(s)
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Lee Kumanchik
We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI). We first discuss instrumentation and procedures required to accurately characterize an

New Reference Standards and Artifacts for Nanoscale Physical Property Characterization

January 1, 2006
Author(s)
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Richard S. Gates, Paul Rice, John M. Moreland
This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications