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Search Publications by: Aaron M. Forster (Fed)

Displaying 76 - 81 of 81

Combinatorial Approach to Characterizing Epoxy Curing

January 1, 2004

Author(s)

Naomi Eidelman, D T. Raghavan, Aaron M. Forster, Eric J. Amis, Alamgir Karim

Three complementary techniques were used to follow the curing of a diglycidyl ether bisphenol A epoxy resin (DGEBA): FT-IR microspectroscopy, confocal microscopy, and axisymmetric adhesion testing. Each technique probes different characteristics of the

Spatial Correlations and Robust Statistical Analysis for Combinatorial Methodologies

January 1, 2004

Author(s)

Eric J. Amis, S B. Kennedy, Aaron M. Forster, N. R. Washburn

High-Throughput Measurements of Polymer Adhesion and Mechanical Properties

September 1, 2003

Author(s)

Christopher Stafford, Aaron M. Forster, C Harrison, Cher H. Davis, Eric J. Amis, Alamgir Karim

Polymer adhesion is important to numerous technologies including electronic packaging, coatings and paints, biomedical implants, and pressure-sensitive adhesives. The challenge is to understand the fundamental driving forces for the development of adhesive

Combinatorial Adhesion Measurements: Factorial Design Concepts for Data Collection and Library Evaluation

January 1, 2003

Author(s)

Aaron M. Forster, Christopher Stafford, Alamgir Karim, Eric J. Amis

Product discovery in the adhesives industry is often characterized by experimental trial and error combined with empirical knowledge. The NIST developed multi-lens combinatorial adhesion test (MCAT) has the potential to increase the efficiency of this

The Influence of Shearing Parameters on the Frictional Forces Measured Between Polymer Brushes

January 1, 2003

Author(s)

Aaron M. Forster, S. M. Kilbey

Polymer brushes have potential as end-tethered lubricants. Brush layers immersed in a good solvent must be compressed to ~16% of their equilibrium height before friction forces are measured. The same experiment in a solvent near the theta temperature will

Polymer Science at the NIST Combinatorial Methods Center

August 1, 2002

Author(s)

Cher H. Davis, Kathryn L. Beers, Aaron M. Forster, Christopher M. Stafford, A P. Smith, C Harrison, Weiping Zhang, Alamgir Karim, Eric J. Amis

The measurements, standards, and test methods developed by NIST, in partnership with other organizations, often help unlock the potential of new discoveries and budding technologies. Combinatorial methods are a textbook example. These emerging tools can