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Search Publications by: Aaron M. Forster (Fed)

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Displaying 151 - 160 of 160

High-Throughput Measurements of Polymer Adhesion and Mechanical Properties

September 1, 2003
Author(s)
Christopher Stafford, Aaron M. Forster, C Harrison, Cher H. Davis, Eric J. Amis, Alamgir Karim
Polymer adhesion is important to numerous technologies including electronic packaging, coatings and paints, biomedical implants, and pressure-sensitive adhesives. The challenge is to understand the fundamental driving forces for the development of adhesive

Polymer Science at the NIST Combinatorial Methods Center

August 1, 2002
Author(s)
Cher H. Davis, Kathryn L. Beers, Aaron M. Forster, Christopher M. Stafford, A P. Smith, C Harrison, Weiping Zhang, Alamgir Karim, Eric J. Amis
The measurements, standards, and test methods developed by NIST, in partnership with other organizations, often help unlock the potential of new discoveries and budding technologies. Combinatorial methods are a textbook example. These emerging tools can