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Search Publications by: Donald Windover (Fed)

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Displaying 26 - 50 of 57

An algorithm for compensation of short-period errors in optical encoders

September 24, 2015
Author(s)
Marcus H. Mendenhall, Donald A. Windover, Albert Henins, James P. Cline
We present a simple way to collect data from an optical position or angle encoder with a readout which interpolates values between the optical features, and to process this data set so as to determine the short-range errors which arise from an

Certification of Standard Reference Material 1976b

September 15, 2015
Author(s)
David R. Black, Donald A. Windover, Marcus H. Mendenhall, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation

Limitations of X-ray reflectometry in the presenceof surface contamination

June 13, 2012
Author(s)
Donald A. Windover, David L. Gil
Intentionally deposited thin films exposed to atmosphere often develop unintentionally deposited few monolayer films of surface contamination. This contamination arises from the diverse population of volatile organics and inorganics in the atmosphere. Such

Thickness and Composition Reference Standards for Semiconductor Metrology

July 22, 2011
Author(s)
Donald Windover, Victor H. Vartanian, Tom Kelly, Tom Larson, David L. Gil
This report from the MET16 project describes tests of X-ray reflectometry (XRR), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atom probe tomography (APT) for thickness and compositional reference metrology.

Certification of Standard Reference Material 660b

June 1, 2011
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

DEoptim: An R Package for Global Optimization by Differential Evolution

May 1, 2011
Author(s)
Katharine M. Mullen, David Ardia , David L. Gil, Donald A. Windover, James P. Cline
This article describes the R package DEoptim which implements the differential evolution algorithm for the global optimization of a real-valued function of a real-valued parameter vector. The implementation of differential evolution in DEoptim interfaces

Standard Reference Material 660b for X-ray Metrology

August 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Certification of NIST Standard Reference Material 640d

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Standard Reference Material 640d for X-ray Metrology

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation